Probe Rotating Atomic Force Microscopy for material characterization

2014 ◽  
Vol 1712 ◽  
Author(s):  
Sang Heon Lee
Keyword(s):  
Atomic Force Microscopy ◽  
Material Characterization ◽  
Standard Sample ◽  
Cartesian Coordinate System ◽  
Arbitrary Direction ◽  
Optical Pickup ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cartesian Coordinate ◽  
Different Characteristics

ABSTRACTAs the conventional atomic force microscopy (AFM) uses a Cartesian coordinate system to scan sample and the probe has different characteristics in each direction, it is impossible to scan in arbitrary direction. Therefore, we present the AFM which is able to rotate its probe. The deflection of cantilever was measured using optical pickup head of DVD drive. For verifying the system feasibility, the multidirectional scanning of the standard sample was carried out. Also we presented the modified structure which includes aligner and mirror to enhance the performance.

scholarly journals Cantilever dynamics in higher-harmonic atomic force microscopy for enhanced material characterization

2017 ◽  
Vol 110-111 ◽  
pp. 332-339 ◽  
Author(s):  
Randi Potekin ◽  
Sajith Dharmasena ◽  
D. Michael McFarland ◽  
Lawrence A. Bergman ◽  
Alexander F. Vakakis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Material Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Higher Harmonic

Measurement Simulation Model and Qualitative Analysis of Tapping Mode Atomic Force Microscopy Under Vibration Environment

2010 ◽  
Author(s):  
Zone-Ching Lin ◽  
Ming-Ho Chou
Keyword(s):  
Atomic Force Microscopy ◽  
Qualitative Analysis ◽  
Standard Sample ◽  
Surface Profile ◽  
Force Microscopy ◽  
External Vibration ◽  
Nano Scale ◽  
Atomic Force ◽  
Probe Size ◽  
Mode Atomic Force Microscopy

This study constructs a novel Tapping Mode Atomic Force Microscopy (TM-AFM) model under vibration environment and analyzes the effect of probe size. The TM-AFM measurements are affected by external vibration and the size of the probe. In this study, a sinusoidal external vibration is applied, and TM-AM fixed-amplitude vibration simulated measurements made. The effect of external vibration on the surface profile acquired the simulated measurement of a nano-scale ladder standard sample. The simulated measurements under sinusoidal vibration are compared with actual experimental measurements without vibration isolation facilities, and the corrugations in the two cases were similar, indicating that the simulated measuring model under sinusoidal wave vibration proposed in this study is effective in qualitative analysis. An external vibration during the TM-AFM measurements causes an error between the measured surface profile of the sample and the actual appearance. Additionally simulated measurements are made on the edge of the nano-scale ladder standard sample, and the wave shape is affected by external vibration. The effects of the bevel angle and radius of the sharp end of the TM-AFM probe on the bevel edge effect of the probe and the measured appearance are studied. Qualitative analysis reveals that the bevel angle. Additionally, a smaller probe radius is associated with a simulated result that is closer to the perpendicular side of the ladder standard sample. The results in this study serve as a reference in the selection of probe size and in the qualitative analysis of the effect of external vibration on TM-AFM measurement.

Nonlinear Interaction Force Analysis of Microcantilevers Utilized in Atomic Force Microscopy

2009 ◽  
Author(s):  
Sohrab Eslami ◽  
Nader Jalili ◽  
Ali Passian ◽  
Laurene Tetard ◽  
Thomas Thundat
Keyword(s):  
Atomic Force Microscopy ◽  
Interaction Force ◽  
Beam Model ◽  
High Frequencies ◽  
Force Microscopy ◽  
Distributed Parameters ◽  
Atomic Force ◽  
General Force ◽  
Cartesian Coordinate ◽  
Tip Mass

This paper presents an Euler-Bernoulli microcantilever beam model utilized in non-contact Atomic Force Microscopy (AFM) systems. A distributed-parameters modeling is considered for such system. The motions of the microcantilever are studied in a general Cartesian coordinate with an excitation at the base such that beam end with a tip mass is subject to a general force. This general force comprising of two attractive and repulsive parts with high power terms is taken as the atomic intermolecular one which has a relation with the displacement between the tip mass and the surface such that the total general force will be in the form of an implicit nonlinear equation. It is most desired to observe the effects of the base excitation in high frequencies on the tip van der Waals interaction force. Hence, the general force will produce a peak in the FFT spectrum corresponding to the frequency of the base.

scholarly journals Understanding Current Instabilities in Conductive Atomic Force Microscopy

Materials ◽  
2019 ◽  
Vol 12 (3) ◽  
pp. 459 ◽  
Author(s):  
Lanlan Jiang ◽  
Jonas Weber ◽  
Francesco Maria Puglisi ◽  
Paolo Pavan ◽  
Luca Larcher ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Computational Models ◽  
Stable State ◽  
Water Film ◽  
Oxide Thickness ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Different Characteristics

: Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the probe tips) and from one study to another (due to the use of probe tips with different characteristics), are still two major problems that may drive CAFM researchers to extract wrong conclusions. In this manuscript, these two issues are statistically analyzed by collecting experimental CAFM data and processing them using two different computational models. Our study indicates that: (i) before their complete degradation, CAFM tips show a stable state with degraded conductance, which is difficult to detect and it requires CAFM tip conductivity characterization before and after the CAFM experiments; and (ii) CAFM tips with low spring constants may unavoidably lead to the presence of a ~1.2 nm thick water film at the tip/sample junction, even if the maximum contact force allowed by the setup is applied. These two phenomena can easily drive CAFM users to overestimate the properties of the samples under test (e.g., oxide thickness). Our study can help researchers to better understand the current shifts that were observed during their CAFM experiments, as well as which probe tip to use and how it degrades. Ultimately, this work may contribute to enhancing the reliability of CAFM investigations.

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