High-precision metrology by means of a novel stereo imaging technique based on atomic force microscopy

2001 ◽  
Author(s):  
Bernardo D. Aumond ◽  
Kamal Youcef-Toumi
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Imaging Technique ◽  
Stereo Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Precision Metrology

High-Precision Single-Molecule Characterization of the Folding of an HIV RNA Hairpin by Atomic Force Microscopy

Nano Letters ◽  
2018 ◽  
Vol 18 (10) ◽  
pp. 6318-6325 ◽  
Author(s):  
Robert Walder ◽  
William J. Van Patten ◽  
Dustin B. Ritchie ◽  
Rebecca K. Montange ◽  
Ty W. Miller ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Single Molecule ◽  
Force Microscopy ◽  
Hiv Rna ◽  
Atomic Force ◽  
Rna Hairpin

High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K

Nanoscale ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 2961-2965 ◽  
Author(s):  
Damla Yesilpinar ◽  
Bertram Schulze Lammers ◽  
Alexander Timmer ◽  
Saeed Amirjalayer ◽  
Harald Fuchs ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Precision ◽  
Organic Molecule ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Bond Lengths ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

AFM experiments at 78 K with an atomically defined O-terminated Cu tip allow determining bond lengths of an organic molecule with high precision.

Nanomanipulator Based on a High-Speed Atomic Force Microscopy

2012 ◽  
Vol 516 ◽  
pp. 396-401
Author(s):  
Itsuhachi Ishisaki ◽  
Yuya Ohashi ◽  
Tatsuo Ushiki ◽  
Futoshi Iwata
Keyword(s):  
Atomic Force Microscopy ◽  
Real Time ◽  
High Speed ◽  
Imaging Technique ◽  
Frame Rate ◽  
High Speed Imaging ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Short Time

We developed a real-time nanomanipulation system based on high-speed atomic force microscopy (HS-AFM). During manipulation, the operation of the manipulation is momentarily interrupted for a very short time for high-speed imaging; thus, the topographical image of the fabricated surface is periodically updated during the manipulation. By using a high-speed imaging technique, the interrupting time could be much reduced during the manipulation; as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. As for the high-speed imaging technique, we employed a contact-mode HS-AFM to obtain topographic information through the instantaneous deflection of the cantilever during high-speed scanning. By using a share motion PZT scanner, the surface could be imaged with a frame rate of several fps. Furthermore, the high-speed AFM was coupled with a haptic device for human interfacing. By using the system, the operator can move the AFM probe into any position on the surface and feel the response from the surface during manipulation. As a demonstration of the system, nanofabrication under real-time monitoring was performed. This system would be very useful for real-time nanomanipulation and fabrication of sample surfaces.

Acquisition of high-precision images for non-contact atomic force microscopy

Mechatronics ◽  
2006 ◽  
Vol 16 (10) ◽  
pp. 655-664 ◽  
Author(s):  
Hossein Nejat Pishkenari ◽  
Nader Jalili ◽  
Ali Meghdari
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals High-precision atomic force microscopy with atomically-characterized tips

2020 ◽  
Vol 22 (6) ◽  
pp. 063040 ◽  
Author(s):  
A Liebig ◽  
A Peronio ◽  
D Meuer ◽  
A J Weymouth ◽  
F J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Force Microscopy ◽  
Atomic Force
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