Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation

2012 ◽  
Vol 83 (9) ◽  
pp. 093709 ◽  
Author(s):  
P. P. Weafer ◽  
J. P. McGarry ◽  
M. H. van Es ◽  
J. I. Kilpatrick ◽  
W. Ronan ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Cell Deformation ◽  
Whole Cell ◽  
Atomic Force ◽  
Stability Enhancement

Force measurement using an ac atomic force microscope

1990 ◽  
Vol 67 (9) ◽  
pp. 4045-4052 ◽  
Author(s):  
William A. Ducker ◽  
Robert F. Cook ◽  
David R. Clarke
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Atomic Force

Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure

2009 ◽  
Vol 131 (6) ◽  
Author(s):  
Florian Krohs ◽  
Cagdas Onal ◽  
Metin Sitti ◽  
Sergej Fatikow
Keyword(s):  
Atomic Force Microscope ◽  
Estimation Method ◽  
Thermal Drift ◽  
Promising Technique ◽  
Drift Estimation ◽  
Atomic Force ◽  
Drift Compensation ◽  
Monte Carlo Localization ◽  
Afm Probe

While the atomic force microscope (AFM) was mainly developed to image the topography of a sample, it has been discovered as a powerful tool also for nanomanipulation applications within the last decade. A variety of different manipulation types exists, ranging from dip-pen and mechanical lithography to assembly of nano-objects such as carbon nanotubes (CNTs), deoxyribonucleic acid (DNA) strains, or nanospheres. The latter, the assembly of nano-objects, is a very promising technique for prototyping nanoelectronical devices that are composed of DNA-based nanowires, CNTs, etc. But, pushing nano-objects in the order of a few nanometers nowadays remains a very challenging, labor-intensive task that requires frequent human intervention. To increase throughput of AFM-based nanomanipulation, automation can be considered as a long-term goal. However, automation is impeded by spatial uncertainties existing in every AFM system. This article focuses on thermal drift, which is a crucial error source for automating AFM-based nanoassembly, since it implies a varying, spatial displacement between AFM probe and sample. A novel, versatile drift estimation method based on Monte Carlo localization is presented and experimental results obtained on different AFM systems illustrate that the developed algorithm is able to estimate thermal drift inside an AFM reliably even with highly unstructured samples and inside inhomogeneous environments.

scholarly journals Cellular Shear Adhesion Force Measurement and Simultaneous Imaging by Atomic Force Microscope

2017 ◽  
Vol 37 (1) ◽  
pp. 102-111 ◽  
Author(s):  
Yu Hou ◽  
Zuobin Wang ◽  
Dayou Li ◽  
Renxi Qiu ◽  
Yan Li ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Force Measurement ◽  
Simultaneous Imaging ◽  
Atomic Force

Atomic force microscope studies of membranes: force measurement and imaging in electrolyte solutions

1997 ◽  
Vol 126 (1) ◽  
pp. 77-89 ◽  
Author(s):  
W. Richard Bowen ◽  
Nidal Hilal ◽  
Robert W. Lovitt ◽  
Adel O. Sharif ◽  
Peter M. Williams
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Electrolyte Solutions ◽  
Atomic Force

Direct Surface Force Measurement for Synthetic Smectites Using the Atomic Force Microscope

Langmuir ◽  
2002 ◽  
Vol 18 (12) ◽  
pp. 4681-4688 ◽  
Author(s):  
Satoshi Nishimura ◽  
Masaya Kodama ◽  
Ken Yao ◽  
Yusuke Imai ◽  
Hiroshi Tateyama
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Surface Force ◽  
Atomic Force

scholarly journals An Investigation of the Adsorption of Xanthate on Bornite in Aqueous Solutions using an Atomic Force Microscope

Minerals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 906
Author(s):  
Jinhong Zhang
Keyword(s):  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Force Measurement ◽  
Attenuated Total Reflection ◽  
Solution Ph ◽  
Substrate Adhesion ◽  
Atomic Force ◽  
Measurement Results ◽  
Industry Practice

An atomic force microscope (AFM) was applied to study of the adsorption of xanthate on bornite surfaces in situ in aqueous solutions. AFM images showed that xanthate, i.e., potassium ethyl xanthate (KEX) and potassium amyl xanthate (PAX), adsorbed strongly on bornite, and the adsorbate bound strongly with the mineral surface without being removed by flushing with ethanol alcohol. The AFM images also showed that the adsorption increased with the increased collector concentration and contact time. Xanthate adsorbed on bornite in a similar manner when the solution pH changed to pH 10. The AFM force measurement results showed that the probe–substrate adhesion increased due to the adsorption of xanthate on bornite. The sharp “jump-in” and “jump-off” points on force curve suggest that the adsorbate is not “soft” in nature, ruling out the existence of dixanthogen, an oily substance. Finally, the ATR-FTIR (attenuated total reflection-Fourier-transform infrared) result confirms that the adsorbate on bornite in xanthate solutions is mainly in the form of insoluble cuprous xanthate (CuX) instead of dixanthogen. This xanthate/bornite adsorption mechanism is very similar to what is obtained with the xanthate/chalcocite system, while it is different from the xanthate/chalcopyrite system, for which oily dixanthogen is the main adsorption product on the chalcopyrite surface. The present study helps clarify the flotation mechanism of bornite in industry practice using xanthate as a collector.

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