Direct Surface Force Measurement for Synthetic Smectites Using the Atomic Force Microscope

Langmuir ◽  
2002 ◽  
Vol 18 (12) ◽  
pp. 4681-4688 ◽  
Author(s):  
Satoshi Nishimura ◽  
Masaya Kodama ◽  
Ken Yao ◽  
Yusuke Imai ◽  
Hiroshi Tateyama
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Surface Force ◽  
Atomic Force

Dynamic Surface Force Measurement. 2. Friction and the Atomic Force Microscope

Langmuir ◽  
1999 ◽  
Vol 15 (2) ◽  
pp. 553-563 ◽  
Author(s):  
Phil Attard ◽  
Archie Carambassis ◽  
Mark W. Rutland
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Surface Force ◽  
Dynamic Surface ◽  
Atomic Force

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

scholarly journals Anomalous Interfacial Structuring of a Non-Halogenated Ionic Liquid: Effect of Substrate and Temperature

2018 ◽  
Vol 2 (4) ◽  
pp. 60 ◽  
Author(s):  
Milad Radiom ◽  
Patricia Pedraz ◽  
Georgia Pilkington ◽  
Patrick Rohlmann ◽  
Sergei Glavatskih ◽  
...  
Keyword(s):  
Ionic Liquid ◽  
Surface Charge ◽  
Force Measurement ◽  
Surface Force ◽  
Solid Surfaces ◽  
Effect Of Temperature ◽  
Decay Length ◽  
Force Microscopy ◽  
Large Size ◽  
Atomic Force

We investigate the interfacial properties of the non-halogenated ionic liquid (IL), trihexyl(tetradecyl)phosphonium bis(mandelato)borate, [P6,6,6,14][BMB], in proximity to solid surfaces, by means of surface force measurement. The system consists of sharp atomic force microscopy (AFM) tips interacting with solid surfaces of mica, silica, and gold. We find that the force response has a monotonic form, from which a characteristic steric decay length can be extracted. The decay length is comparable with the size of the ions, suggesting that a layer is formed on the surface, but that it is diffuse. The long alkyl chains of the cation, the large size of the anion, as well as crowding of the cations at the surface of negatively charged mica, are all factors which are likely to oppose the interfacial stratification which has, hitherto, been considered a characteristic of ionic liquids. The variation in the decay length also reveals differences in the layer composition at different surfaces, which can be related to their surface charge. This, in turn, allows the conclusion that silica has a low surface charge in this aprotic ionic liquid. Furthermore, the effect of temperature has been investigated. Elevating the temperature to 40 °C causes negligible changes in the interaction. At 80 °C and 120 °C, we observe a layering artefact which precludes further analysis, and we present the underlying instrumental origin of this rather universal artefact.

Force measurement using an ac atomic force microscope

1990 ◽  
Vol 67 (9) ◽  
pp. 4045-4052 ◽  
Author(s):  
William A. Ducker ◽  
Robert F. Cook ◽  
David R. Clarke
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Atomic Force

scholarly journals Cellular Shear Adhesion Force Measurement and Simultaneous Imaging by Atomic Force Microscope

2017 ◽  
Vol 37 (1) ◽  
pp. 102-111 ◽  
Author(s):  
Yu Hou ◽  
Zuobin Wang ◽  
Dayou Li ◽  
Renxi Qiu ◽  
Yan Li ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Force Measurement ◽  
Simultaneous Imaging ◽  
Atomic Force

scholarly journals Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM

2011 ◽  
Vol 2 ◽  
pp. 76-79
Author(s):  
Purna B Pun ◽  
Shobha K Lamichhane
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Thermal Oxidation ◽  
Surface Force ◽  
Surface Forces ◽  
Crystal Defects ◽  
Surface Contamination ◽  
Thermal Agitation ◽  
Atomic Force ◽  
Aluminum Sample

The surface contamination affects Atomic Force Microscope (AFM) performance. Thermal agitation during mapping doping, thermal oxidation, annealing impurities and crystal defects promotes the roughness; various kinds of forces on the surface can be detected by the interaction between tip of cantilever and sample. This interaction not only help us to understand the characteristics and morphology of the sample but also useful to measure the surface force of the aluminum sample too.Key words: Atomic Force Microscope (AFM) performance; Thermal oxidation; Annealing impurities; Crystal defectsThe Himalayan Physics Vol.2, No.2, May, 2011Page: 76-79Uploaded Date: 1 August, 2011

Sign in / Sign up

Export Citation Format

Share Document