Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure

2009 ◽  
Vol 131 (6) ◽  
Author(s):  
Florian Krohs ◽  
Cagdas Onal ◽  
Metin Sitti ◽  
Sergej Fatikow
Keyword(s):  
Atomic Force Microscope ◽  
Estimation Method ◽  
Thermal Drift ◽  
Promising Technique ◽  
Drift Estimation ◽  
Atomic Force ◽  
Drift Compensation ◽  
Monte Carlo Localization ◽  
Afm Probe

While the atomic force microscope (AFM) was mainly developed to image the topography of a sample, it has been discovered as a powerful tool also for nanomanipulation applications within the last decade. A variety of different manipulation types exists, ranging from dip-pen and mechanical lithography to assembly of nano-objects such as carbon nanotubes (CNTs), deoxyribonucleic acid (DNA) strains, or nanospheres. The latter, the assembly of nano-objects, is a very promising technique for prototyping nanoelectronical devices that are composed of DNA-based nanowires, CNTs, etc. But, pushing nano-objects in the order of a few nanometers nowadays remains a very challenging, labor-intensive task that requires frequent human intervention. To increase throughput of AFM-based nanomanipulation, automation can be considered as a long-term goal. However, automation is impeded by spatial uncertainties existing in every AFM system. This article focuses on thermal drift, which is a crucial error source for automating AFM-based nanoassembly, since it implies a varying, spatial displacement between AFM probe and sample. A novel, versatile drift estimation method based on Monte Carlo localization is presented and experimental results obtained on different AFM systems illustrate that the developed algorithm is able to estimate thermal drift inside an AFM reliably even with highly unstructured samples and inside inhomogeneous environments.

Wear Characteristics of Atomic Force Microscope Probe Tips

2005 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Dae-Eun Kim
Keyword(s):  
Electron Microscope ◽  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Wear Characteristics ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Probe ◽  
Silicon Silicon ◽  
Microscope Probe ◽  
Scanning Electron

In the field of nanotechnology, Atomic Force Microscope (AFM) which is based on the interactions between an extremely sharp probe tip and specimen, has been widely utilized. In the AFM and AFM-based applications, the probe tip wear problem should be carefully considered. In this work, the wear characteristics of silicon, silicon nitride, and diamond coated probe tip under light loads were investigated. In order to identify the structure of the AFM probe tips as well as the nature of wear, High-Resolution Transmission Electron Microscope (HRTEM) and Field Emission Scanning Electron Microscope (FESEM) analyses were utilized. Using the Archard’s wear equation, the degree of the probe tip wear was quantitatively assessed. Based on the experimental results and analysis, the plausible wear mechanisms of the AFM probe tips were proposed in an effort to understand the nano-scale wear.

Fabrication of Coaxial and Triaxial Atomic Force Microscope Imaging Probes

2014 ◽  
Vol 1712 ◽  
Author(s):  
Keith A. Brown ◽  
Robert M. Westervelt
Keyword(s):  
Atomic Force Microscope ◽  
Physical Vapor Deposition ◽  
Focused Ion Beam ◽  
Imaging Techniques ◽  
Ion Beam ◽  
Atomic Force ◽  
Imaging Probes ◽  
Microscope Imaging ◽  
Afm Probe ◽  
General Method

ABSTRACTHerein, we detail the fabrication of atomic force microscope (AFM) probes that have two and three coaxial electrodes at their tips. This fabrication strategy leverages the availability of conductive AFM probes and encompasses a general method for processing their complex and delicate structure through the deposition of insulating and conductive layers by shadow masked chemical and physical vapor deposition, respectively. Focused ion beam milling is used to expose the two electrode (coaxial) or three electrode (triaxial) structures at the tip of the AFM probe. Finally, we discuss new imaging modalities enabled by these probes including electrically-driven contact resonance imaging for nanoscale mechanical characterization, imaging the local dielectric constant by quantifying the dielectrophoretic force, and trapping functional particles at the tip of a probe using dielectrophoresis. These imaging techniques illustrate the generality and utility of this fabrication approach and suggest that such probes could be widely applied to image many nanoscale materials.

Active drift compensation applied to nanorod manipulation with an atomic force microscope

2007 ◽  
Vol 78 (11) ◽  
pp. 115103 ◽  
Author(s):  
E. Tranvouez ◽  
E. Boer-Duchemin ◽  
G. Comtet ◽  
G. Dujardin
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Drift Compensation

scholarly journals Формирование наноразмерных ферромагнитных филаментов Ni в пленках ZrO-=SUB=-2-=/SUB=-(Y)

2021 ◽  
Vol 47 (11) ◽  
pp. 30
Author(s):  
Д.А. Антонов ◽  
А.С. Новиков ◽  
Д.О. Филатов ◽  
А.В. Круглов ◽  
И.Н. Антонов ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Resistive Switching ◽  
Magnetic Force ◽  
Single Domain ◽  
Ferromagnetic Particle ◽  
Conducting Filament ◽  
Atomic Force ◽  
Bipolar Type ◽  
Afm Probe

In thin ZrO2 (Y) / Ni films, with used of an atomic force microscope (AFM) probe, conductive ferromagnetic filaments of nanometer sizes, consisting of Ni atoms, are formed. Memristor structures based on such films, the upper electrode of which was the AFM probe, demonstrated bipolar-type resistive switching (RP) associated with the destruction and reduction of Ni filaments. The area where the conducting filament emerges on the surface of the ZrO2 (Y) film manifested itself in the magnetic force image as a single-domain ferromagnetic particle.

Characteristics Analysis for Nanosoldering with Atomic Force Microscope

NANO ◽  
2018 ◽  
Vol 13 (04) ◽  
pp. 1850040
Author(s):  
Zenglei Liu ◽  
Ailian Gao ◽  
Shuangxi Xie ◽  
Niandong Jiao ◽  
Lianqing Liu
Keyword(s):  
Atomic Force Microscope ◽  
Field Emission ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Mechanical Characteristics ◽  
Atomic Force ◽  
Characteristics Analysis ◽  
Potential Applications ◽  
Effect Transistor ◽  
Afm Probe

Field-emission deposition of atomic force microscope (AFM) can be used to fabricate nanopads, and therefore has potential applications in soldering nanodevices. However, the soldering effects are hard to verify because the soldering pads are of nanoscale. This paper studied the electrical, thermal and mechanical characteristics of the deposited nanopads, in order to testify the soldering effects. For this purpose, first, a carbon nanotube field effect transistor (CNTFET) was soldered to see whether the conductivity of the transistor was improved. Next, the thermal performance of the nanopads were observed by heating them in an oven. Last, the nanopads were mechanically pushed by an AFM probe to test the physical connection between the nanopads and the substrate. Experimental results showed that the nanosoldering dramatically reduced the contact resistance of the transistor. Moreover, the nanopads could withstand high temperature and mechanical push. Consequently, field-emission deposition of the AFM promised a bright future in nanosoldering.

Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints

2002 ◽  
Vol 73 (6) ◽  
pp. 2305-2307 ◽  
Author(s):  
Johannes H. Kindt ◽  
James B. Thompson ◽  
Mario B. Viani ◽  
Paul K. Hansma
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Drift Compensation

Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation

2012 ◽  
Vol 83 (9) ◽  
pp. 093709 ◽  
Author(s):  
P. P. Weafer ◽  
J. P. McGarry ◽  
M. H. van Es ◽  
J. I. Kilpatrick ◽  
W. Ronan ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Force Measurement ◽  
Cell Deformation ◽  
Whole Cell ◽  
Atomic Force ◽  
Stability Enhancement

Imaging Cell Surface Macromolecular Distribution by Mapping Intermolecular Interactions with an Atomic Force Microscope

2000 ◽  
Vol 6 (S2) ◽  
pp. 976-977
Author(s):  
R. Bhatia ◽  
H. Lin ◽  
A. Quist ◽  
G. Primbs ◽  
N. Desai ◽  
...  
Keyword(s):  
Endothelial Cells ◽  
Cell Surface ◽  
Atomic Force Microscope ◽  
Real Time ◽  
Intermolecular Interactions ◽  
Growth Factor Receptor ◽  
Atomic Force ◽  
Afm Imaging ◽  
Recent Developments ◽  
Afm Probe

An atomic force microscope (AFM) can image real-time intermolecular interactions between complementary macromolecules, such as receptor-ligand and antigen-antibody with nanometer resolution in hydrated state. Recent developments in AFM imaging allow mapping of such interaction forces over a large surface area such that local as well as global distribution of complementary biomolecules could be ascertained simultaneously. Using the force-volume maps and AFM probe conjugated with antibody, we have mapped the reorganization of specific receptors on the cell surface as well as the resultant changes in cellular micromechanical properties, such as elasticity and cytoskeletal reorganization of the cell (Figure 1).In present study, we have mapped vascular endothelial growth factor receptor (VEGF-R) in the plasma membrane of cultured endothelial cells using anti-VEGFR - antibody conjugated to AFM probe. VEGF induced changes in cytoskeleton reorganization in endothelial cells were observed by real-time AFM imaging.

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