Low-temperature pseudo-metal-oxide-semiconductor field-effect transistor measurements on bare silicon-on-insulator wafers
2009 ◽
Vol 48
(7)
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pp. 071204
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2003 ◽
Vol 20
(5)
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pp. 767-769
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2008 ◽
Vol 47
(11)
◽
pp. 8297-8304
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1993 ◽
Vol 64
(10)
◽
pp. 3024-3025
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2011 ◽
Vol 50
(11R)
◽
pp. 110210
◽