Direct determination of the effect of strain on domain morphology in ferroelectric superlattices with scanning probe microscopy

K. Kathan-Galipeau; P. P. Wu; Y. L. Li; L. Q. Chen; A. Soukiassian; Y. Zhu; D. A. Muller; X. X. Xi; D. G. Schlom; D. A. Bonnell

doi:10.1063/1.4746081

Direct determination of the effect of strain on domain morphology in ferroelectric superlattices with scanning probe microscopy

Journal of Applied Physics ◽

10.1063/1.4746081 ◽

2012 ◽

Vol 112 (5) ◽

pp. 052011 ◽

Cited By ~ 6

Author(s):

K. Kathan-Galipeau ◽

P. P. Wu ◽

Y. L. Li ◽

L. Q. Chen ◽

A. Soukiassian ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Direct Determination ◽

Scanning Probe ◽

Probe Microscopy

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Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants

10.3403/30199161 ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s1027451019010051 ◽

2019 ◽

Vol 13 (1) ◽

pp. 53-55

Author(s):

M. S. Dunaevskiy ◽

P. A. Alekseev ◽

P. Geydt ◽

E. Lahderanta ◽

T. Haggren ◽

...

Keyword(s):

Young’S Modulus ◽

Scanning Probe Microscopy ◽

Young's Modulus ◽

Scanning Probe ◽

Probe Microscopy

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Using scanning probe microscopy and nanomoter surface profiler of DEKTAK for determination of thermal stress in quasi-monolithic integration technology (QMIT)

10.1117/12.452550 ◽

2001 ◽

Author(s):

Mojtaba Joodaki ◽

Teoman Senyildiz ◽

Guenter Kompa ◽

Rainer Kassing ◽

Hartmut Hillmer

Keyword(s):

Thermal Stress ◽

Scanning Probe Microscopy ◽

Monolithic Integration ◽

Scanning Probe ◽

Integration Technology ◽

Probe Microscopy

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Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques

Omsk Scientific Bulletin ◽

10.25206/1813-8225-2018-159-114-117 ◽

2018 ◽

pp. 114-117 ◽

Cited By ~ 1

Author(s):

D. V. Sokolov ◽

◽

N. A. Davletkildeev ◽

I. A. Lobov ◽

◽

...

Keyword(s):

Carbon Nanotube ◽

Scanning Probe Microscopy ◽

Multiwalled Carbon Nanotube ◽

Scanning Probe ◽

Electrical Parameters ◽

Multiwalled Carbon ◽

Probe Microscopy ◽

Microscopy Techniques

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Application of scanning probe microscopy for the determination of the structural accuracy of high aspect ratio microstructures

Microelectronic Engineering ◽

10.1016/s0167-9317(00)00394-4 ◽

2000 ◽

Vol 53 (1-4) ◽

pp. 637-640 ◽

Cited By ~ 7

Author(s):

S. Achenbach ◽

J. Mohr ◽

F.J. Pantenburg

Keyword(s):

Aspect Ratio ◽

Scanning Probe Microscopy ◽

High Aspect Ratio ◽

Scanning Probe ◽

Probe Microscopy

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Features of determination of the surface roughness using scanning probe microscopy

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques ◽

10.1134/s1027451016030137 ◽

2016 ◽

Vol 10 (3) ◽

pp. 567-569

Author(s):

V. A. Novikov

Keyword(s):

Surface Roughness ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Surface chemical analysis � Scanning probe microscopy � Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

10.3403/30351708u ◽

2020 ◽

Keyword(s):

Chemical Analysis ◽

Atomic Force Microscope ◽

Scanning Probe Microscopy ◽

Elastic Moduli ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Atomic Force ◽

Surface Chemical Analysis

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Summary of ISO/TC 201 standard: ISO 11775:2015 - Surface chemical analysis - Scanning probe microscopy - Determination of cantilever normal spring constants

Surface and Interface Analysis ◽

10.1002/sia.6078 ◽

2016 ◽

Vol 49 (3) ◽

pp. 171-172

Author(s):

Charles A. Clifford

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants

10.3403/30199161u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Determination of the mechanical behavior of lithium disilicate glass ceramics by nanoindentation & scanning probe microscopy

Materials Chemistry and Physics ◽

10.1016/j.matchemphys.2014.09.015 ◽

2014 ◽

Vol 148 (3) ◽

pp. 1036-1044 ◽

Cited By ~ 14

Author(s):

Calvin M. Smith ◽

Danyu Jiang ◽

Jianghong Gong ◽

Ling Yin

Keyword(s):

Mechanical Behavior ◽

Scanning Probe Microscopy ◽

Glass Ceramics ◽

Lithium Disilicate ◽

Scanning Probe ◽

Probe Microscopy

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