Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants

Mapping Intimacies ◽

10.3403/30199161u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants

10.3403/30199161 ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Summary of ISO/TC 201 standard: ISO 11775:2015 - Surface chemical analysis - Scanning probe microscopy - Determination of cantilever normal spring constants

Surface and Interface Analysis ◽

10.1002/sia.6078 ◽

2016 ◽

Vol 49 (3) ◽

pp. 171-172

Author(s):

Charles A. Clifford

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Surface chemical analysis � Scanning probe microscopy � Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

10.3403/30351708u ◽

2020 ◽

Keyword(s):

Chemical Analysis ◽

Atomic Force Microscope ◽

Scanning Probe Microscopy ◽

Elastic Moduli ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Atomic Force ◽

Surface Chemical Analysis

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Surface chemical analysis � Scanning probe microscopy � Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

10.3403/30351708 ◽

2020 ◽

Keyword(s):

Chemical Analysis ◽

Atomic Force Microscope ◽

Scanning Probe Microscopy ◽

Elastic Moduli ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Atomic Force ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope

10.3403/30165037 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Near Field ◽

Optical Microscope ◽

Scanning Probe ◽

Lateral Resolution ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate

10.3403/30199183 ◽

2012 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Drift Rate ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Microscopy Measurement ◽

Surface Chemical Analysis

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Surface chemical analysis. Data transfer format for scanning-probe microscopy

10.3403/30199180 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Data Transfer ◽

Analysis Data ◽

Scanning Probe ◽

Surface Chemical ◽

Chemical Analysis Data ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

10.3403/30203228u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Spatial Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Summary of ISO/TC 201 standard: ISO 18115-2:2013 - surface chemical analysis - vocabulary - terms used in scanning probe microscopy

Surface and Interface Analysis ◽

10.1002/sia.5474 ◽

2014 ◽

Vol 46 (5) ◽

pp. 361-364 ◽

Cited By ~ 3

Author(s):

Martin P. Seah

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate

10.3403/30199183u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Drift Rate ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Microscopy Measurement ◽

Surface Chemical Analysis

Download Full-text