Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors

2012 ◽  
Vol 100 (23) ◽  
pp. 232101 ◽  
Author(s):  
Tien-Yu Hsieh ◽  
Ting-Chang Chang ◽  
Te-Chih Chen ◽  
Ming-Yen Tsai ◽  
Yu-Te Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Degradation Behavior ◽  
Heating Effect ◽  
Self Heating

Systematic Investigations on Self-Heating-Effect-Induced Degradation Behavior in a-InGaZnO Thin-Film Transistors

2012 ◽  
Vol 59 (12) ◽  
pp. 3389-3395 ◽  
Author(s):  
Tien-Yu Hsieh ◽  
Ting-Chang Chang ◽  
Te-Chih Chen ◽  
Yu-Te Chen ◽  
Ming-Yen Tsai ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Degradation Behavior ◽  
Heating Effect ◽  
Self Heating

Analysis of Self-Heating Effect on Short Channel Amorphous InGaZnO Thin-Film Transistors

2015 ◽  
Vol 36 (5) ◽  
pp. 472-474 ◽  
Author(s):  
Seok-Woo Lee ◽  
Pyo Jin Jeon ◽  
Kyunghee Choi ◽  
Sung-Wook Min ◽  
Hyeokjae Kwon ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Heating Effect ◽  
Short Channel ◽  
Self Heating ◽  
Amorphous Ingazno

Thermoreflectance microscopy analysis on self-heating effect of short-channel amorphous In-Ga-Zn-O thin film transistors

2014 ◽  
Vol 105 (4) ◽  
pp. 043501 ◽  
Author(s):  
Jong In Kim ◽  
Ki Soo Chang ◽  
Dong Uk Kim ◽  
In-Tak Cho ◽  
Chan-Yong Jeong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Heating Effect ◽  
Short Channel ◽  
Self Heating ◽  
Microscopy Analysis ◽  
Thermoreflectance Microscopy

Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors

2013 ◽  
Vol 34 (1) ◽  
pp. 63-65 ◽  
Author(s):  
Tien-Yu Hsieh ◽  
Ting-Chang Chang ◽  
Te-Chih Chen ◽  
Yu-Te Chen ◽  
Ming-Yen Tsai ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Heating Effect ◽  
Self Heating ◽  
Degradation Behaviors

Roles of Gate Voltage and Stress Power in Self-Heating Degradation of a-InGaZnO Thin-Film Transistors

2021 ◽  
pp. 1-5
Author(s):  
Mengjun Du ◽  
Jinfeng Zhao ◽  
Dongli Zhang ◽  
Huaisheng Wang ◽  
Qi Shan ◽  
...  
Keyword(s):  
Thin Film ◽  
Gate Voltage ◽  
Thin Film Transistors ◽  
Self Heating

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

2017 ◽  
Vol 32 (2) ◽  
pp. 91-96
Author(s):  
张猛 ZHANG Meng ◽  
夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
陈荣盛 CHEN Rong-sheng ◽  
王文 WONG Man ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress
Sign in / Sign up

Export Citation Format

Share Document