scholarly journals Publisher’s Note: “Role of dual-laser ablation in controlling the Pb depletion in epitaxial growth of Pb(Zr0.52Ti0.48)O3 thin films with enhanced surface quality and ferroelectric properties” [J. Appl. Phys. 111, 064102 (2012)]

2012 ◽  
Vol 111 (8) ◽  
pp. 089905 ◽  
Author(s):  
Devajyoti Mukherjee ◽  
Robert Hyde ◽  
Pritish Mukherjee ◽  
Hariharan Srikanth ◽  
Sarath Witanachchi
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Epitaxial Growth ◽  
Surface Quality ◽  
Ferroelectric Properties ◽  
Enhanced Surface ◽  
Dual Laser

Epitaxial growth and ferroelectric properties of SrBi2Nb2O9(115) thin films grown by pulsed-laser deposition on epitaxial Pt(111) electrode

2003 ◽  
Vol 83 (26) ◽  
pp. 5500-5502 ◽  
Author(s):  
J.-R. Duclère ◽  
M. Guilloux-Viry ◽  
V. Bouquet ◽  
A. Perrin ◽  
E. Cattan ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Epitaxial Growth ◽  
Ferroelectric Properties ◽  
Pulsed Laser ◽  
Laser Deposition

Epitaxial growth of PbFe12O19 thin films by alternating target laser ablation deposition of Fe2O3 and PbO

2007 ◽  
Vol 101 (9) ◽  
pp. 09M510 ◽  
Author(s):  
A. L. Geiler ◽  
Y. He ◽  
S. D. Yoon ◽  
A. Yang ◽  
Y. Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Epitaxial Growth

Preparation of PZT/YBCO/YAIO Heterostructure Thin Films by KrF Excimer Laser Ablation

1998 ◽  
Vol 526 ◽  
Author(s):  
Kenji Ebihara ◽  
Hiromnitsu Kurogi ◽  
Yukihiko Yamagata ◽  
Tomoaki Ikegami ◽  
Alexander M. Grishin
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Excimer Laser ◽  
Ferroelectric Properties ◽  
Perovskite Oxide ◽  
Excimer Laser Ablation ◽  
Fatigue Characteristics ◽  
Krf Excimer Laser ◽  
Operation Frequency ◽  
Deposition Conditions

AbstractThe perovskite oxide YBa2Cu3O7-x (YBCO) and Pb(ZrxTi1-x)O3 (PZT) thin films have been deposited for superconducting-ferroelectric devices. KrF excimer laser ablation technique was used at the deposition conditions of 200-600mTorr O2, 2-3J/cm2 and 5-10 Hz operation frequency. Heterostructures of PZT-YBCO-YAlO3:Nd show the zero resistivity critical temperature of 82K and excellent ferroelectric properties of remnant polarization 32 μC/cm2, coercive force of 80kV/cm and dielectric constant 800. Cycling fatigue characteristics and leakage current are also discussed.

Preparation of PbZrxTi1−xO3 Thin Films by KrF Excimer Laser Ablation Technique

1996 ◽  
Vol 433 ◽  
Author(s):  
Hiromitsu Kurogi ◽  
Yukihiko Yamagata ◽  
Tomoaki Ikegami ◽  
Kenji Ebihara ◽  
Bok Yin Tong
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Excimer Laser ◽  
Oxygen Pressure ◽  
Ferroelectric Properties ◽  
Pzt Thin Films ◽  
Excimer Laser Ablation ◽  
Pzt Films ◽  
Krf Excimer Laser ◽  
Laser Ablation Technique

AbstractPb(ZrxTi1−x)O3(PZT) thin films have excellent ferroelectric, optical, piezoelectric and pyroelectric properties. We prepared PZT thin films using the excimer laser ablation technique. A pulsed KrF excimer laser was used to ablate PZT bulk targets. We have studied optimum preparation conditions such as an oxygen pressure, a laser energy fluence and a substrate temperature.In this paper, we investigated the composition, crystallization and ferroelectric properties of the PZT films prepared under various deposition conditions.The X-ray diffraction (XRD) patterns showed that the PZT films prepared on MgO(100) substrates at 600°C and with a laser fluence of 2J/cm2 had a perovskite - pyrochlore mixed structure. The condition of 100 mTorr oxygen pressure provided high quality perovskite films. It is found that the stoichiometric composition of the deposited films is obtained in ambient oxygen of 100˜400 mTorr. The ferroelectric properties of the Pt/PZT/Pt/MgO structure were studied. The capacitance-voltage characteristics and the corresponding hysteresis loop of the dielectric-electric field curve were discussed.We also studied optical emission of the PZT plasma plume to understand quantitative relation between the PZT film quality and the ablation plume plasma. We identified spectral lines originated in Pb, Pb+, Zr, Zr+, Ti, Ti+, PbO and TiO. These spectral intensities have remarkable dependence on the ambient O2 pressure.

The role of nanoporosity on the local piezo and ferroelectric properties of lead titanate thin films

2015 ◽  
Vol 3 (5) ◽  
pp. 1035-1043 ◽  
Author(s):  
Alichandra Castro ◽  
Paula Ferreira ◽  
Brian J. Rodriguez ◽  
Paula M. Vilarinho
Keyword(s):  
Thin Films ◽  
Coercive Field ◽  
Lead Titanate ◽  
Ferroelectric Properties ◽  
Ferroelectric Thin Films ◽  
Piezoelectric Response ◽  
Nanoporous Films ◽  
Switching Behaviour ◽  
Dense Films

Nanoporous PbTiO3 films present enhanced tetragonality at lower temperatures than respective dense films. Moreover, the porosity present in the nanoporous films allows an increase of the local piezoelectric response and a decrease of the local coercive field. As a result, these nanoporous films might be used to improve the switching behaviour of ferroelectric thin films.

The Role of Bi 2 O 3 Interfacial Layer in Improvement of Ferroelectric Properties of SrBi 2 Ta 2 O 9 Thin Films Deposited by Liquid-Delivery MOCVD

2002 ◽  
Vol 46 (1) ◽  
pp. 205-214 ◽  
Author(s):  
Nak-Jin Seong ◽  
Woong-Chul Shin ◽  
Eun-Suck Choi ◽  
Sung-Nam Ryoo ◽  
Soon-Gil Yoon
Keyword(s):  
Thin Films ◽  
Interfacial Layer ◽  
Ferroelectric Properties ◽  
Liquid Delivery

Epitaxial growth and nanoscale electrical properties of Ce2Ti2O7 thin films

RSC Advances ◽  
2016 ◽  
Vol 6 (39) ◽  
pp. 32994-33002 ◽  
Author(s):  
Alexandre Bayart ◽  
ZhenMian Shao ◽  
Anthony Ferri ◽  
Pascal Roussel ◽  
Rachel Desfeux ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Epitaxial Growth ◽  
Ferroelectric Properties

Growth and ferroelectric properties of Ce2Ti2O7 thin films.

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