A grazing incidence x‐ray diffraction study of the transverse structure function of the liquid–vapor interface of Ga

1992 ◽  
Vol 96 (6) ◽  
pp. 4743-4749 ◽  
Author(s):  
Erik B. Flom ◽  
Zhong‐hou Cai ◽  
Anibal Acero ◽  
Bin‐hua Lin ◽  
Nissan Maskil ◽  
...  
Keyword(s):  
Structure Function ◽  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Transverse Structure ◽  
Vapor Interface ◽  
X Ray ◽  
Liquid Vapor

In-Plane Structure of the Liquid-Vapor Interface of an Alloy: A Grazing Incidence X-ray Diffraction Study of Bismuth:Gallium

Science ◽  
1993 ◽  
Vol 260 (5106) ◽  
pp. 332-335 ◽  
Author(s):  
E. B. Flom ◽  
M. Li ◽  
A. Acero ◽  
N. Maskil ◽  
S. A. Rice
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Vapor Interface ◽  
X Ray ◽  
Liquid Vapor

In situx-ray reflectivity and grazing incidence x-ray diffraction study ofL10ordering in57Fe/Pt multilayers

2009 ◽  
Vol 21 (18) ◽  
pp. 186002 ◽  
Author(s):  
V Raghavendra Reddy ◽  
Ajay Gupta ◽  
Anil Gome ◽  
Wolfram Leitenberger ◽  
U Pietsch
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Comparative Studies on the Influence of β-Sitosterol and Stigmasterol on Model Sphingomyelin Membranes: A Grazing-Incidence X-ray Diffraction Study

2010 ◽  
Vol 114 (20) ◽  
pp. 6866-6871 ◽  
Author(s):  
Katarzyna Hąc-Wydro ◽  
Michał Flasiński ◽  
Marcin Broniatowski ◽  
Patrycja Dynarowicz-Łątka ◽  
Jarosław Majewski
Keyword(s):  
Diffraction Study ◽  
Comparative Studies ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Atomic structure of the CdTe(001) C(2×2) reconstructed surface: A grazing incidence x‐ray diffraction study

1995 ◽  
Vol 67 (26) ◽  
pp. 3957-3959 ◽  
Author(s):  
M. B. Veron ◽  
M. Sauvage‐Simkin ◽  
V. H. Etgens ◽  
S. Tatarenko ◽  
H. A. Van Der Vegt ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Atomic Structure ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstructed Surface

scholarly journals Grazing incidence X-ray diffraction study of interfacial superstructure: a-Si on Ge0.2Si0.8(111)-5×5

1987 ◽  
Vol 43 (a1) ◽  
pp. C122-C122
Author(s):  
K. Akimoto ◽  
J. Mizuki ◽  
I. Hirosawa ◽  
T. Tatsumi ◽  
N. Aizaki ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Time resolved x‐ray diffraction study of laser annealing in silicon at grazing incidence

1989 ◽  
Vol 66 (8) ◽  
pp. 3523-3525 ◽  
Author(s):  
J. R. Buschert ◽  
J. Z. Tischler ◽  
D. M. Mills ◽  
Q. Zhao ◽  
R. Colella
Keyword(s):  
Diffraction Study ◽  
Laser Annealing ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray
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