Atomic structure of the CdTe(001) C(2×2) reconstructed surface: A grazing incidence x‐ray diffraction study

1995 ◽  
Vol 67 (26) ◽  
pp. 3957-3959 ◽  
Author(s):  
M. B. Veron ◽  
M. Sauvage‐Simkin ◽  
V. H. Etgens ◽  
S. Tatarenko ◽  
H. A. Van Der Vegt ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Atomic Structure ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstructed Surface

In situx-ray reflectivity and grazing incidence x-ray diffraction study ofL10ordering in57Fe/Pt multilayers

2009 ◽  
Vol 21 (18) ◽  
pp. 186002 ◽  
Author(s):  
V Raghavendra Reddy ◽  
Ajay Gupta ◽  
Anil Gome ◽  
Wolfram Leitenberger ◽  
U Pietsch
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

In-Plane Structure of the Liquid-Vapor Interface of an Alloy: A Grazing Incidence X-ray Diffraction Study of Bismuth:Gallium

Science ◽  
1993 ◽  
Vol 260 (5106) ◽  
pp. 332-335 ◽  
Author(s):  
E. B. Flom ◽  
M. Li ◽  
A. Acero ◽  
N. Maskil ◽  
S. A. Rice
Keyword(s):  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Vapor Interface ◽  
X Ray ◽  
Liquid Vapor

Comparative Studies on the Influence of β-Sitosterol and Stigmasterol on Model Sphingomyelin Membranes: A Grazing-Incidence X-ray Diffraction Study

2010 ◽  
Vol 114 (20) ◽  
pp. 6866-6871 ◽  
Author(s):  
Katarzyna Hąc-Wydro ◽  
Michał Flasiński ◽  
Marcin Broniatowski ◽  
Patrycja Dynarowicz-Łątka ◽  
Jarosław Majewski
Keyword(s):  
Diffraction Study ◽  
Comparative Studies ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Atomic Structure of Amorphous PbTiO3, PbFe1/2Nb1/2O3and PbMg1/3Nb2/3O3: A Comparative X-Ray Diffraction Study

2004 ◽  
Vol 307 (1) ◽  
pp. 199-203 ◽  
Author(s):  
V. V. POSMET'YEV ◽  
L. N. KOROTKOV ◽  
S. N. KOZHUKHAR ◽  
I. V. BABKINA ◽  
Yu. V. BARMIN
Keyword(s):  
Diffraction Study ◽  
Atomic Structure ◽  
X Ray Diffraction ◽  
X Ray

Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction

2007 ◽  
Vol 556-557 ◽  
pp. 533-536
Author(s):  
M. Silly ◽  
H. Enriquez ◽  
J. Roy ◽  
M. D'Angelo ◽  
P. Soukiassian ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Surface Structure ◽  
Surface Reconstruction ◽  
Structure Determination ◽  
Atomic Structure ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Wires ◽  
Atomic Lines

In order to give experimental insights on the atomic structure of the Si atomic wires developing on the β-SiC(100) surface, we use synchrotron radiation-based x-ray diffraction at grazing incidence to study a network of such atomic lines in a 5x2 surface array. Our results lead to an accurate surface and sub-surface structure determination evidencing a structure in agreement with a two adlayer symmetric dimer reconstruction. This atomic structure is significantly different from the 3x2 surface structure, giving new insights on the Si atomic lines stability.

Sign in / Sign up

Export Citation Format

Share Document