High speed characteristics of thin film write heads at deep submicron track width

2000 ◽  
Vol 87 (9) ◽  
pp. 5416-5418 ◽  
Author(s):  
Chris Y. Mao ◽  
Jian-Gang Zhu ◽  
Robert M. White
Keyword(s):  
Thin Film ◽  
High Speed ◽  
Deep Submicron ◽  
Track Width ◽  
Write Heads

The Wear Features of a Plasma Thin-Film Coating on High-Speed Steel

2020 ◽  
Vol 41 (2) ◽  
pp. 160-168
Author(s):  
I. A. Rastegaev ◽  
I. I. Rastegaeva ◽  
D. L. Merson ◽  
V. A. Korotkov
Keyword(s):  
Thin Film ◽  
High Speed ◽  
High Speed Steel ◽  
Film Coating ◽  
Thin Film Coating

scholarly journals Advanced Electrode Design for Low-Voltage High-Speed Thin-Film Lithium Niobate Modulators

2021 ◽  
Vol 13 (2) ◽  
pp. 1-9
Author(s):  
Xingrui Huang ◽  
Yang Liu ◽  
Zezheng Li ◽  
Huan Guan ◽  
Qingquan Wei ◽  
...  
Keyword(s):  
Thin Film ◽  
Lithium Niobate ◽  
High Speed ◽  
Low Voltage ◽  
Electrode Design

Frequency and transient response of yoke flux for 45/55 NiFe and CoTaZr thin film write heads

1999 ◽  
Vol 35 (5) ◽  
pp. 2508-2510 ◽  
Author(s):  
J. Jury ◽  
P. George ◽  
J.H. Judy
Keyword(s):  
Thin Film ◽  
Transient Response ◽  
Write Heads

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals High-Speed Epitaxy Using Supersonic Molecular Jets

1990 ◽  
Vol 201 ◽  
Author(s):  
Djula Eres
Keyword(s):  
Thin Film ◽  
Growth Rates ◽  
High Speed ◽  
Film Growth ◽  
Thin Film Growth ◽  
Free Form ◽  
Electrical Measurements ◽  
Growth Technique ◽  
Pulsed Jets ◽  
Gaseous Source

AbstractThis paper discusses the use of supersonic jets of gaseous source molecules in thin film growth. Molecular jets in free form with no skimmers or collimators in the nozzle-substrate path were used in the investigation of basic film growth processes and in practical film growth applications. The Ge growth rates were found to depend linearly on the digermane jet intensity. Furthermore, the film thickness distributions showed excellent agreement with the distribution of digermane molecules in the jet. High epitaxial Ge growth rates were achieved on GaAs (100) substrates by utilizing high-intensity pulsed jets. The practical advantages and limitations of this film growth technique are evaluated, based on the results of microstructural and electrical measurements of heteroepitaxial Ge films on GaAs (100) substrates.

scholarly journals Improvements Evaluation of High-Speed Electro-Optical Integrated Thin-Film Microwave Coupler SOA-based Space Switch

2018 ◽  
Vol 17 (4) ◽  
pp. 477-485
Author(s):  
Tiago Sutili ◽  
Rafael C. Figueiredo ◽  
Napoleão S. Ribeiro ◽  
Cristiano M. Gallep ◽  
Evandro Conforti
Keyword(s):  
Thin Film ◽  
High Speed ◽  
Microwave Coupler
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