Structural and electrical characterization of microcrystalline silicon films prepared by a layer-by-layer technique with a plasma-enhanced chemical-vapor deposition system
2005 ◽
Vol E88-C
(4)
◽
pp. 640-645
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1997 ◽
Vol 15
(2)
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pp. 428
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2000 ◽
Vol 266-269
◽
pp. 31-37
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Keyword(s):
2020 ◽
Vol 38
(5)
◽
pp. 052205
1991 ◽
Vol 115
(1-4)
◽
pp. 498-503
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