Structural and electrical characterization of microcrystalline silicon films prepared by a layer-by-layer technique with a plasma-enhanced chemical-vapor deposition system

2000 ◽  
Vol 87 (4) ◽  
pp. 1676-1680 ◽  
Author(s):  
J. P. Hong ◽  
C. O. Kim ◽  
T. U. Nahm ◽  
C. M. Kim
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