Secondary ion mass spectroscopy study of Al diffusion in sandwich-ZnSTe structures grown by molecular beam epitaxy

Z. H. Ma; T. Smith; I. K. Sou

doi:10.1063/1.371084

Secondary ion mass spectroscopy study of Al diffusion in sandwich-ZnSTe structures grown by molecular beam epitaxy

Journal of Applied Physics ◽

10.1063/1.371084 ◽

1999 ◽

Vol 86 (5) ◽

pp. 2505-2508 ◽

Cited By ~ 7

Author(s):

Z. H. Ma ◽

T. Smith ◽

I. K. Sou

Keyword(s):

Molecular Beam Epitaxy ◽

Mass Spectroscopy ◽

Molecular Beam ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Secondary-ion mass spectroscopy (SIMS) investigations of Be and Si incorporation in GaN grown by molecular beam epitaxy (MBE)

Semiconductor Science and Technology ◽

10.1088/0268-1242/11/4/014 ◽

1996 ◽

Vol 11 (4) ◽

pp. 538-541 ◽

Cited By ~ 11

Author(s):

T S Cheng ◽

C T Foxon ◽

L C Jenkins ◽

S E Hooper ◽

D E Lacklison ◽

...

Keyword(s):

Molecular Beam Epitaxy ◽

Mass Spectroscopy ◽

Molecular Beam ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Secondary ion mass spectroscopy investigations of magnesium and carbon doped gallium nitride films grown by molecular beam epitaxy

Semiconductor Science and Technology ◽

10.1088/0268-1242/13/1/010 ◽

1998 ◽

Vol 13 (1) ◽

pp. 71-74 ◽

Cited By ~ 25

Author(s):

B Ya Ber ◽

Yu A Kudriavtsev ◽

A V Merkulov ◽

S V Novikov ◽

D E Lacklison ◽

...

Keyword(s):

Gallium Nitride ◽

Molecular Beam Epitaxy ◽

Mass Spectroscopy ◽

Molecular Beam ◽

Secondary Ion Mass Spectroscopy ◽

Carbon Doped ◽

Secondary Ion

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Influence of surfactants on molecular beam epitaxial grown SiGe single quantum wells studied by photoluminescence and secondary ion mass spectroscopy investigations

Selected Topics in Group IV and II–VI Semiconductors ◽

10.1016/b978-0-444-82411-0.50015-2 ◽

1996 ◽

pp. 31-35

Author(s):

H.P. Zeindl ◽

S. Nilsson ◽

J. Klatt ◽

D. Krüger ◽

R. Kurps

Keyword(s):

Quantum Wells ◽

Mass Spectroscopy ◽

Molecular Beam ◽

Single Quantum ◽

Secondary Ion Mass Spectroscopy ◽

Molecular Beam Epitaxial ◽

Secondary Ion

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Diffusion of polymers at interfaces: a secondary ion mass spectroscopy study

Macromolecules ◽

10.1021/ma00022a006 ◽

1991 ◽

Vol 24 (22) ◽

pp. 5926-5938 ◽

Cited By ~ 82

Author(s):

Scott J. Whitlow ◽

Richard P. Wool

Keyword(s):

Mass Spectroscopy ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Secondary Ion Mass Spectroscopy Study of Oxygen-18 Tracer Diffusion in 2/1-Mullite Single Crystals

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.2001.tb01103.x ◽

2001 ◽

Vol 84 (12) ◽

pp. 2845-2848 ◽

Cited By ~ 25

Author(s):

Peter Fielitz ◽

Günter Borchardt ◽

Martin Schmücker ◽

Hartmut Schneider ◽

Michael Wiedenbeck ◽

...

Keyword(s):

Single Crystals ◽

Mass Spectroscopy ◽

Tracer Diffusion ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Hydrogen interaction with nickel(100): a static secondary ion mass spectroscopy study

The Journal of Physical Chemistry ◽

10.1021/j100324a056 ◽

1988 ◽

Vol 92 (13) ◽

pp. 3970-3974 ◽

Cited By ~ 19

Author(s):

X. Y. Zhu ◽

J. M. White

Keyword(s):

Mass Spectroscopy ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Hydrogen Interaction ◽

Secondary Ion

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Secondary ion mass spectroscopy study of Zn or Cd implanted and rapid thermally annealed Pd/Ge contacts top‐In0.53Ga0.47As

Applied Physics Letters ◽

10.1063/1.112137 ◽

1994 ◽

Vol 65 (9) ◽

pp. 1174-1176 ◽

Cited By ~ 6

Author(s):

P. Ressel ◽

H. Strusny ◽

M. Trapp ◽

H. Kräutle ◽

D. Fritzsche

Keyword(s):

Mass Spectroscopy ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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X-ray photoelectron spectroscopy and static secondary ion mass spectroscopy study of activation mechanism of Zr–V low activation temperature nonevaporable getter films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1562175 ◽

2003 ◽

Vol 21 (3) ◽

pp. 797-805 ◽

Cited By ~ 17

Author(s):

Karel Mas̆ek ◽

Frantis̆ek S̆utara ◽

Tomás̆ Skála ◽

Jir̆ı́ Drbohlav ◽

Kater̆ina Veltruská ◽

...

Keyword(s):

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Activation Mechanism ◽

Spectroscopy Study ◽

Activation Temperature ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Static secondary ion mass spectroscopy study of ethylene and acetylene on Ni: Coverage dependence

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575999 ◽

1989 ◽

Vol 7 (3) ◽

pp. 1991-1995 ◽

Cited By ~ 11

Author(s):

X.‐Y. Zhu ◽

M. E. Castro ◽

S. Akhter ◽

J. M. White ◽

J. E. Houston

Keyword(s):

Mass Spectroscopy ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Coverage Dependence ◽

Secondary Ion

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A time-of-flight secondary ion mass spectroscopy study of 1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide RT-ionic liquid

Surface Science ◽

10.1016/j.susc.2008.09.018 ◽

2008 ◽

Vol 602 (21) ◽

pp. 3403-3407 ◽

Cited By ~ 29

Author(s):

Jens Günster ◽

Oliver Höfft ◽

Stefan Krischok ◽

Ryutaro Souda

Keyword(s):

Ionic Liquid ◽

Mass Spectroscopy ◽

Time Of Flight ◽

Spectroscopy Study ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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