Resistivity and oxygen content of indium tin oxide films deposited at room temperature by pulsed-laser ablation
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1999 ◽
Vol 142
(1-4)
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pp. 248-252
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1999 ◽
Vol 138-139
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pp. 522-526
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2000 ◽
Vol 39
(Part 2, No. 4B)
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pp. L377-L379
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2003 ◽
Vol 429
(1-2)
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pp. 220-224
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2002 ◽
Vol 71
(1)
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pp. 1-8
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