Experimental analysis and computer simulation of a methodology for laser focusing in the solar cell characterization by laser beam induced current

2012 ◽  
Vol 83 (4) ◽  
pp. 043102 ◽  
Author(s):  
J. Navas ◽  
R. Alcántara ◽  
C. Fernández-Lorenzo ◽  
J. Martín-Calleja
Keyword(s):  
Computer Simulation ◽  
Solar Cell ◽  
Laser Beam ◽  
Experimental Analysis ◽  
Induced Current ◽  
Cell Characterization ◽  
Laser Focusing

Hyperspectral laser beam induced current system for solar cell characterization

2015 ◽  
Author(s):  
Ahsan Ashraf ◽  
Kristopher O. Davis ◽  
Kortan Ogutman ◽  
Winston V. Schoenfeld ◽  
Matthew D. Eisaman
Keyword(s):  
Solar Cell ◽  
Laser Beam ◽  
Current System ◽  
Induced Current ◽  
Cell Characterization

A precision method for laser focusing on laser beam induced current experiments

2002 ◽  
Vol 73 (11) ◽  
pp. 3895-3900 ◽  
Author(s):  
J. A. Poce-Fatou ◽  
J. Martı́n ◽  
R. Alcántara ◽  
C. Fernández-Lorenzo
Keyword(s):  
Laser Beam ◽  
Induced Current ◽  
Precision Method ◽  
Laser Focusing

Quantitative Defect Analysis on Solar Cells by Laser Beam Induced Current (LBIC) Measurements and 3D Network Simulations

2013 ◽  
Vol 1493 ◽  
pp. 195-200 ◽  
Author(s):  
Minh Nguyen ◽  
Andreas Schütt ◽  
Jürgen Carstensen ◽  
Helmut Föll
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Laser Beam ◽  
Equivalent Circuit Model ◽  
Adjacent Area ◽  
Local Defect ◽  
Current Response ◽  
Induced Current ◽  
Shunt Resistance ◽  
3D Network

ABSTRACTMeasurements with the CELLO (solar cell local characterization) technique in the LBIC (laser beam induced current) mode under dark conditions with various constant bias voltages are used to analyze the lateral distribution, and mean values, of photocurrent response maps. Local solar cell defects such as local shunts were found to have a characteristic bias voltage dependence: At negative and small positive voltages a local shunt resistance gives less current response than the adjacent area. Upon applying higher positive voltages, a transition of the mean value to lower current response and an inversion of the local defect characteristics are found. These results were modeled by a newly introduced three dimensional (3D) equivalent circuit model of a solar cell divided into subcells.Measurements and simulations of solar cells with various local defects show our method to be a new powerful tool for the quantitative analysis of local solar cell defects.

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