In situ scanning tunneling microscopy characterization of step bunching on miscut Si(111) surfaces in fluoride solutions

1999 ◽  
Vol 85 (3) ◽  
pp. 1545-1549
Author(s):  
Peter M. Hoffmann ◽  
Inge E. Vermeir ◽  
Arun Natarajan ◽  
Peter C. Searson
ACS Nano ◽  
2013 ◽  
Vol 7 (10) ◽  
pp. 8529-8539 ◽  
Author(s):  
Quy Khac Ong ◽  
Javier Reguera ◽  
Paulo Jacob Silva ◽  
Mauro Moglianetti ◽  
Kellen Harkness ◽  
...  

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