Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers

Nano Letters ◽  
2009 ◽  
Vol 9 (12) ◽  
pp. 4446-4451 ◽  
Author(s):  
Ke Xu ◽  
Peigen Cao ◽  
James R. Heath
ACS Nano ◽  
2013 ◽  
Vol 7 (10) ◽  
pp. 8529-8539 ◽  
Author(s):  
Quy Khac Ong ◽  
Javier Reguera ◽  
Paulo Jacob Silva ◽  
Mauro Moglianetti ◽  
Kellen Harkness ◽  
...  

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