Effects of oxygen content on properties of silicon oxide films prepared at room temperature by sputtering-type electron cyclotron resonance plasma

1998 ◽  
Vol 84 (8) ◽  
pp. 4579-4584 ◽  
Author(s):  
Katsuhiko Furukawa ◽  
Yichun Liu ◽  
Hiroshi Nakashima ◽  
Dawei Gao ◽  
Yasuhiro Kashiwazaki ◽  
...  
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