Atomic layer deposited (TiO2)x(Al2O3)1−x/In0.53Ga0.47As gate stacks for III-V based metal-oxide-semiconductor field-effect transistor applications
Keyword(s):
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2003 ◽
Vol 42
(Part 1, No. 8)
◽
pp. 5010-5013
◽
2010 ◽
Vol 49
(12)
◽
pp. 126501
◽