Atomic layer deposited (TiO2)x(Al2O3)1−x/In0.53Ga0.47As gate stacks for III-V based metal-oxide-semiconductor field-effect transistor applications

2012 ◽  
Vol 100 (6) ◽  
pp. 062905 ◽  
Author(s):  
C. Mahata ◽  
S. Mallik ◽  
T. Das ◽  
C. K. Maiti ◽  
G. K. Dalapati ◽  
...  
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