Determination of Defect Densities in High Electron Mobility Transistors Using Current Transient DLTS

2011 ◽  
Author(s):  
John Palma ◽  
Samson Mil'shtein ◽  
Jisoon Ihm ◽  
Hyeonsik Cheong
2021 ◽  
pp. 108050
Author(s):  
Maria Glória Caño de Andrade ◽  
Luis Felipe de Oliveira Bergamim ◽  
Braz Baptista Júnior ◽  
Carlos Roberto Nogueira ◽  
Fábio Alex da Silva ◽  
...  

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