Effect of annealing time on bias stress and light-induced instabilities in amorphous indium–gallium–zinc-oxide thin-film transistors

2011 ◽  
Vol 110 (11) ◽  
pp. 114503 ◽  
Author(s):  
Md Delwar Hossain Chowdhury ◽  
Sang Hyun Ryu ◽  
Piero Migliorato ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Annealing Time ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Indium Gallium

Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor

2012 ◽  
Vol 101 (12) ◽  
pp. 123502 ◽  
Author(s):  
Piero Migliorato ◽  
Md Delwar Hossain Chowdhury ◽  
Jae Gwang Um ◽  
Manju Seok ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Indium Gallium
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