Local density of trap states in SiO2 and Si3N4 films studied by single electron tunneling force spectroscopy
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2004 ◽
Vol 22
(1-3)
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pp. 434-437
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2002 ◽
Vol 12
(1-4)
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pp. 853-856
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1994 ◽
Vol 194-196
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pp. 1309-1310
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1993 ◽
Vol 3
(1)
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pp. 1980-1982
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