Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopy

2011 ◽  
Vol 98 (5) ◽  
pp. 052902 ◽  
Author(s):  
J. P. Johnson ◽  
D. W. Winslow ◽  
C. C. Williams
Keyword(s):  
Electron Tunneling ◽  
Force Spectroscopy ◽  
Single Electron ◽  
Dielectric Films ◽  
Trap States ◽  
Single Electron Tunneling

Sensing of dynamic charge states using single-electron tunneling transistors

1998 ◽  
Vol 168 (2) ◽  
pp. 219
Author(s):  
V.A. Krupenin ◽  
S.V. Lotkhov ◽  
H. Scherer ◽  
A.B. Zorin ◽  
F.-J. Ahlers ◽  
...  
Keyword(s):  
Electron Tunneling ◽  
Single Electron ◽  
Single Electron Tunneling ◽  
Dynamic Charge ◽  
Charge States

Silicon single-electron tunneling device fabricated in an undulated ultrathin silicon-on-insulator film

2001 ◽  
Vol 90 (7) ◽  
pp. 3551-3557 ◽  
Author(s):  
Ken Uchida ◽  
Junji Koga ◽  
Ryuji Ohba ◽  
Shin-ichi Takagi ◽  
Akira Toriumi
Keyword(s):  
Electron Tunneling ◽  
Silicon On Insulator ◽  
Single Electron ◽  
Insulator Film ◽  
Single Electron Tunneling
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