Characterization of bias stress induced electrical instability in liquid-crystalline semiconducting polymer thin-film transistors

2011 ◽  
Vol 110 (8) ◽  
pp. 084511 ◽  
Author(s):  
Jiyoul Lee ◽  
Do Hwan Kim ◽  
Bang-Lin Lee ◽  
Jeong-Il Park ◽  
Byungwook Yoo ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Liquid Crystalline ◽  
Polymer Thin Film ◽  
Semiconducting Polymer ◽  
Bias Stress ◽  
Electrical Instability

Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress

2013 ◽  
Vol 102 (14) ◽  
pp. 143502 ◽  
Author(s):  
Chunhyung Jo ◽  
Sungwoo Jun ◽  
Woojoon Kim ◽  
Inseok Hur ◽  
Hagyoul Bae ◽  
...  
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Bias Stress ◽  
Parasitic Resistance

Electrical instability of polymer thin-film transistors using contact film transfer methods

2010 ◽  
Vol 96 (24) ◽  
pp. 243301 ◽  
Author(s):  
Qingshuo Wei ◽  
Keisuke Tajima ◽  
Kazuhito Hashimoto
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polymer Thin Film ◽  
Electrical Instability ◽  
Film Transfer

Modeling and Characterization of the Abnormal Hump in n-Channel Amorphous-InGaZnO Thin-Film Transistors After High Positive Bias Stress

2015 ◽  
Vol 36 (10) ◽  
pp. 1047-1049 ◽  
Author(s):  
Jungmin Lee ◽  
Sungju Choi ◽  
Seong Kwang Kim ◽  
Sung-Jin Choi ◽  
Dae Hwan Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Positive Bias ◽  
Bias Stress ◽  
Amorphous Ingazno

Effect of Illumination on Organic Polymer Thin-Film Transistors

2003 ◽  
Vol 771 ◽  
Author(s):  
Michael C. Hamilton ◽  
Sandrine Martin ◽  
Jerzy Kanicki
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Charge Carriers ◽  
Electrical Performance ◽  
Organic Polymer ◽  
Light Illumination ◽  
Polymer Thin Film ◽  
Channel Region ◽  
White Light Illumination

AbstractWe have investigated the effects of white-light illumination on the electrical performance of organic polymer thin-film transistors (OP-TFTs). The OFF-state drain current is significantly increased, while the drain current in the strong accumulation regime is relatively unaffected. At the same time, the threshold voltage is decreased and the subthreshold slope is increased, while the field-effect mobility of the charge carriers is not affected. The observed effects are explained in terms of the photogeneration of free charge carriers in the channel region due to the absorbed photons.

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering
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