Bistable Si growth conditions on Ge(100) in synchrotron-radiation-excited atomic layer epitaxy from SiH2Cl2

1997 ◽  
Vol 81 (7) ◽  
pp. 3320-3322 ◽  
Author(s):  
Housei Akazawa
1991 ◽  
Vol 222 ◽  
Author(s):  
P. C. Colter ◽  
S. A. Hussien ◽  
A. Dip ◽  
M. U. Erdogan ◽  
S. M. Bedair

ABSTRACTReactor design considerations are discussed relevant to the two main problems, carbon contamination and low growth rate, facing Atomic Layer Epitaxy (ALE) of GaAs. A new reactor design addressing these problems is described. It utilizes the concept of rotating the substrate between streams of reactant gases. The growth chamber provides baffles and gas jets to shear off and sweep away the thermal boundary layer after exposure to the reactive gas streams. Construction is based on modification of a commercially available low pressure MOCVD reactor equipped with a. load lock. The reactor is capable of processing three, two-inch wafers. A background carbon concentration of about 1015cm−3 and a 77°K mobility of 30,000 cm2/V-sec were achieved. Self limited growth was observed for a growth temperature as high as 600 °C. Controlled p- and n-type doping was accomplished by changing growth conditions and adding silane.


1996 ◽  
Vol 35 (Part 1, No. 10) ◽  
pp. 5416-5420 ◽  
Author(s):  
Chun Hsing Liu ◽  
Meiso Yokoyama ◽  
Yan Kuin Su

2020 ◽  
Vol 59 (SG) ◽  
pp. SGGF10
Author(s):  
Masahiro Kawano ◽  
Ryo Minematsu ◽  
Tomohiro Haraguchi ◽  
Atsuhiko Fukuyama ◽  
Hidetoshi Suzuki

1996 ◽  
Vol 80 (4) ◽  
pp. 2363-2366 ◽  
Author(s):  
Hiroyuki Fujiwara ◽  
Toshiyuki Nabeta ◽  
Isamu Shimizu ◽  
Takashi Yasuda

1989 ◽  
Vol 55 (3) ◽  
pp. 244-246 ◽  
Author(s):  
Weon G. Jeong ◽  
E. P. Menu ◽  
P. D. Dapkus

Sign in / Sign up

Export Citation Format

Share Document