Interpretation of double‐crystal x‐ray rocking curves in relaxed strained‐layer structures

1996 ◽  
Vol 79 (6) ◽  
pp. 3011-3015 ◽  
Author(s):  
M. A. Lourenço ◽  
D. J. Dunstan
Keyword(s):  
Double Crystal ◽  
X Ray ◽  
Strained Layer ◽  
Layer Structures

Measurement of Elastic Lattice Distortion in PbTe/PbSnTe - Strained Layer Superlatices by Asymmetric High Angle X-ray interfernces

1985 ◽  
Vol 29 ◽  
pp. 367-374
Author(s):  
E. J. Fantner
Keyword(s):  
Elastic Strain ◽  
Lattice Mismatch ◽  
Strain Tensor ◽  
Misfit Strain ◽  
High Angle ◽  
Double Crystal ◽  
X Ray ◽  
Strained Layer ◽  
Thermal Expansion Coefficients ◽  
Quaternary Compounds

AbstractElastic strain significantly affects the electric and optical properties of PbTe/Pb1-xSnxTe - strained-layer superlattices. In the range of 10 - 350K the temperature dependence of the elastic strain present in these superlattices was measured by double-crystal x-ray diffraction. For superlattice periods smaller than 100nm High-angle x-ray interferences were observed. Using a novel method, which makes use of the High-angle interferences both for symmetrical as well as for asymmetrical reflections in a theta-twotheta scan with a narrow detector slit, the relative inclination of equivalent lattice planes due the elastic strain was measured. The components of the complete strain tensor of the constituent layers can be determined seperately even if their unstrained lattice constants are not known with sufficient accuracy as is the case in ternary and quaternary compounds. The lattice mismatch of up to 0.4% for Sn-contents smaller than 20% was found to be accommodated almost completely by elastic misfit strain. The amount of strain is shared between the constituent layers inversely to their relative thicknesses as long as the superlattice as a whole is much thicker than the buffer layer. Below room temperature an additional temperature dependent tensile strain due to differnt thermal expansion coefficients of the film and the BaF2-substrate is measured quantitatively.

Mbe Growth of Strained-Layer InSb/InAlSb Structures

1990 ◽  
Vol 198 ◽  
Author(s):  
C.R. Whitehouse ◽  
C.F. Mcconville ◽  
G.M. Williams ◽  
A.G. Cullis ◽  
S.J. Barnett ◽  
...  
Keyword(s):  
Quantum Wells ◽  
Critical Thickness ◽  
Multiple Quantum ◽  
Material System ◽  
X Ray Diffraction ◽  
Mbe Growth ◽  
X Ray ◽  
Strained Layer ◽  
Transmission Electron ◽  
Layer Structures

ABSTRACTThe MBE growth and related materials characterisation of InSb/InAlSb strained-layer structures is described. Band-gap considerations and critical thickness calculations are presented and indicate that this material system should offer considerable device potential. Detailed structural studies, performed using both transmission electron microscopy and X-ray diffraction, confirm the growth of high quality multiple quantum-wells, and 2K photoluminescence has shown corresponding energy upshifted transitions.

X-ray topography and EBIC studies of misfit dislocations in strained layer structures

1987 ◽  
Vol 102 ◽  
Author(s):  
N. Hamaguchi ◽  
T. P. Humphreys ◽  
C. A. Parker ◽  
S. M. Bedair ◽  
B-L. Jiang ◽  
...  
Keyword(s):  
Critical Thickness ◽  
Misfit Dislocations ◽  
X Ray ◽  
Strained Layer ◽  
Layer Structures ◽  
Lattice Matched

ABSTRACTX-ray topography(XRT) and EBIC have been used to study the generation of misfit dislocations in strained layer structures. Two structures studied were GaAs1−yPy(y=0.15) film and SLS consisting of InxGa1−xAs(x=0.08) and GaAs1−y Py(y=0.16) layers. XRT and EBIC techniques gave consistent results for the behavior of dislocations. The value of the critical thickness for generation of misfit dislocations in the former was found to be few times larger than that in the latter. EBIC image showed that a SLS lattice matched to the substrate is effective in reducing defects originating from the substrate.

scholarly journals X-RAY DOUBLE-CRYSTAL DIFFRACTION STUDY OF HIGH QUALITY GexSi1-x/Si STRAINED LAYER SUPERLATTICE

1991 ◽  
Vol 40 (3) ◽  
pp. 441
Author(s):  
TIAN LIANG-GUANG ◽  
ZHU NAN-CHANG ◽  
CHEN JING-YI ◽  
LI RUN-SHEN ◽  
XU SHUN-SHENG ◽  
...  
Keyword(s):  
Diffraction Study ◽  
High Quality ◽  
Double Crystal ◽  
X Ray ◽  
Strained Layer ◽  
Strained Layer Superlattice
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