Study of shear force as a distance regulation mechanism for scanning near‐field optical microscopy

C. Durkan; I. V. Shvets

doi:10.1063/1.361014

Study of shear force as a distance regulation mechanism for scanning near‐field optical microscopy

Journal of Applied Physics ◽

10.1063/1.361014 ◽

1996 ◽

Vol 79 (3) ◽

pp. 1219-1223 ◽

Cited By ~ 18

Author(s):

C. Durkan ◽

I. V. Shvets

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Regulation Mechanism ◽

Distance Regulation

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A phase-locked shear-force microscope for distance regulation in near-field optical microscopy

Applied Physics Letters ◽

10.1063/1.118318 ◽

1997 ◽

Vol 70 (4) ◽

pp. 405-407 ◽

Cited By ~ 67

Author(s):

Walid A. Atia ◽

Christopher C. Davis

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Distance Regulation

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A novel ultrasonic resonance sample-tip distance regulation for near field optical microscopy and shear force microscopy

Solid State Communications ◽

10.1016/0038-1098(95)00787-3 ◽

1996 ◽

Vol 98 (7) ◽

pp. 661-664 ◽

Cited By ~ 10

Author(s):

X Zhu ◽

G.S Huang ◽

H.T Zhou ◽

Y.D Dai

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Microscopy ◽

Ultrasonic Resonance ◽

Shear Force Microscopy ◽

Distance Regulation

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Novel nonoptical method of tip-sample distance regulation based on shear force in scanning near-field optical microscopy

10.1117/12.347824 ◽

1999 ◽

Author(s):

Xiumei Liu ◽

Jia Wang ◽

Dacheng Li

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Distance Regulation ◽

Sample Distance

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A distance regulation scheme for scanning near‐field optical microscopy

Applied Physics Letters ◽

10.1063/1.115770 ◽

1996 ◽

Vol 68 (24) ◽

pp. 3497-3499 ◽

Cited By ~ 25

Author(s):

A. Dräbenstedt ◽

J. Wrachtrup ◽

C. von Borczyskowski

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Regulation Scheme ◽

Distance Regulation

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Shear force distance control in near-field optical microscopy: experimental evidence of the frictional probe–sample interaction

Ultramicroscopy ◽

10.1016/s0304-3991(99)00169-2 ◽

2000 ◽

Vol 83 (1-2) ◽

pp. 17-23 ◽

Cited By ~ 12

Author(s):

D.A Lapshin ◽

E.E Kobylkin ◽

V.S Letokhov

Keyword(s):

Experimental Evidence ◽

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Distance Control

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Reflection Shear Force/Near-Field Scanning Optical Microscopy (NSOM)

Near Field Optics ◽

10.1007/978-94-011-1978-8_6 ◽

1993 ◽

pp. 45-50 ◽

Cited By ~ 3

Author(s):

P. J. Moyer ◽

M. A. Paesler

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Shear force/reflection near-field scanning optical microscopy

10.1117/12.146363 ◽

1993 ◽

Cited By ~ 9

Author(s):

Patrick J. Moyer ◽

Michael A. Paesler

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Reflection ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Shear force microscopy with capacitance detection for near‐field scanning optical microscopy

Applied Physics Letters ◽

10.1063/1.113269 ◽

1995 ◽

Vol 66 (11) ◽

pp. 1432-1434 ◽

Cited By ~ 23

Author(s):

J‐K. Leong ◽

C. C. Williams

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Microscopy ◽

Capacitance Detection ◽

Scanning Optical Microscopy ◽

Shear Force Microscopy ◽

Near Field Scanning

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Shear Force Detection Using Single-Tine Oscillating Tuning Fork for Scanning Near-Field Optical Microscopy

Chinese Physics Letters ◽

10.1088/0256-307x/20/3/307 ◽

2003 ◽

Vol 20 (3) ◽

pp. 338-341 ◽

Cited By ~ 1

Author(s):

Tan Xiao-Jing ◽

Sun Jia-Lin ◽

Liu Sheng ◽

Guo Ji-Hua ◽

Sun Hong-San

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Tuning Fork ◽

Near Field ◽

Force Detection

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Effective image and spectral data acquisition method used in scanning near-field optical microscopy by bimorph-based shear force sensor

2013 IEEE International Conference on Imaging Systems and Techniques (IST) ◽

10.1109/ist.2013.6729682 ◽

2013 ◽

Author(s):

Wei Cai ◽

Mu Yang ◽

Yingjie Wang ◽

Guangyi Shang

Keyword(s):

Data Acquisition ◽

Optical Microscopy ◽

Spectral Data ◽

Shear Force ◽

Near Field ◽

Force Sensor ◽

Acquisition Method

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