scholarly journals Comment on ‘‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’’ [J. Appl. Phys.74, 291 (1993)]

1994 ◽  
Vol 75 (2) ◽  
pp. 1242-1242 ◽  
Author(s):  
C. Eiche ◽  
D. Maier ◽  
J. Weese ◽  
J. Honerkamp ◽  
K. W. Benz
Keyword(s):  
Inverse Problem ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Semiconductor Materials ◽  
Spectroscopy Analysis ◽  
Strong Disorder ◽  
Computational Aspects ◽  
Transient Spectroscopy

Improved linear prediction for deep level transient spectroscopy analysis

1996 ◽  
Vol 80 (5) ◽  
pp. 2805-2814 ◽  
Author(s):  
Edward A. Ingham ◽  
James D. Scofield ◽  
Meir Pachter
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Linear Prediction ◽  
Deep Level ◽  
Spectroscopy Analysis ◽  
Transient Spectroscopy

Deep level transient spectroscopy analysis of fast ion tracks in silicon

1990 ◽  
Vol 67 (3) ◽  
pp. 1266-1271 ◽  
Author(s):  
A. Hallén ◽  
B. U. R. Sundqvist ◽  
Z. Paska ◽  
B. G. Svensson ◽  
M. Rosling ◽  
...  
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Spectroscopy Analysis ◽  
Ion Tracks ◽  
Transient Spectroscopy ◽  
Fast Ion
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