Erratum: “Frequency noise in frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 80, 043708 (2009)]

2010 ◽  
Vol 81 (12) ◽  
pp. 129901 ◽  
Author(s):  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Frequency Noise ◽  
Force Microscopy ◽  
Atomic Force

Frequency noise in frequency modulation atomic force microscopy

2009 ◽  
Vol 80 (4) ◽  
pp. 043708 ◽  
Author(s):  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Frequency Noise ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Resolving Structure and Mechanical Properties at the Nanoscale of Viruses with Frequency Modulation Atomic Force Microscopy

PLoS ONE ◽  
2012 ◽  
Vol 7 (1) ◽  
pp. e30204 ◽  
Author(s):  
David Martinez-Martin ◽  
Carolina Carrasco ◽  
Mercedes Hernando-Perez ◽  
Pedro J. de Pablo ◽  
Julio Gomez-Herrero ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy

2009 ◽  
Vol 94 (2) ◽  
pp. 023108 ◽  
Author(s):  
Yoshiaki Sugimoto ◽  
Takashi Namikawa ◽  
Masayuki Abe ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Self-assembled monolayers of sulfonate-terminated alkanethiols investigated by frequency modulation atomic force microscopy in liquid

2017 ◽  
Vol 28 (45) ◽  
pp. 455603 ◽  
Author(s):  
Hitoshi Asakawa ◽  
Natsumi Inada ◽  
Kaito Hirata ◽  
Sayaka Matsui ◽  
Takumi Igarashi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method

2010 ◽  
Vol 3 (6) ◽  
pp. 065205 ◽  
Author(s):  
Ken-ichi Umeda ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Yoshiki Hirata ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Excitation Method
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