Polarization mode preservation in elliptical index tailored optical fibers for apertureless scanning near-field optical microscopy

2010 ◽  
Vol 97 (10) ◽  
pp. 103108 ◽  
Author(s):  
Christoph Zeh ◽  
Ron Spittel ◽  
Sonja Unger ◽  
Jörg Opitz ◽  
Bernd Köhler ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Optical Fibers ◽  
Near Field ◽  
Polarization Mode

Near-Field Scanning Optical Microscopy Studies of Materials and Devices

MRS Bulletin ◽  
1997 ◽  
Vol 22 (8) ◽  
pp. 27-30 ◽  
Author(s):  
J.W.P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Light Source ◽  
Optical Fibers ◽  
Force Feedback ◽  
Near Field ◽  
Single Mode ◽  
Field Zone ◽  
Research Activities ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy (NSOM) provides a means to study optical and optoelectronic properties of materials at the nanometer scale. The key to achieving resolution higher than the diffraction limit is to place a subwavelength-sized light source—e.g., an aperture—within the near-field zone of the sample. In this case, the area of the sample illuminated is determined by the aperture size and not by the wavelength (see Figure 1). An image can then be formed by moving the sample and light source with respect to each other. While the principle of near-field optics is straightforward, its realization at visible-light wavelengths was not achieved until the invention of scanning-probe techniques in the 1980s. Since Betzig et al. demonstrated in 1991 that bright subwavelength apertures can be made by tapering and metal-coating single-mode optical fibers, research activities involving NSOM have increased tremendously. The later incorporation of shear-force feedback to regulate tip-sample separation adds another strength to NSOM. Using this distance regulation, a topographic image similar to that obtained by a conventional scanning force microscope is acquired simultaneously with the optical image. This provides a way to correlate structural and physical properties at the same sample positions and greatly simplifies interpretation of the NSOM data.

An inverse problem of estimating the heat source in tapered optical fibers for scanning near-field optical microscopy

2007 ◽  
Vol 107 (8) ◽  
pp. 656-662 ◽  
Author(s):  
Haw-Long Lee ◽  
Win-Jin Chang ◽  
Wen-Lih Chen ◽  
Yu-Ching Yang
Keyword(s):  
Inverse Problem ◽  
Heat Source ◽  
Optical Microscopy ◽  
Optical Fibers ◽  
Near Field

Tip-Enhanced Near-Field Optical Microscopy of Quasi-1 D Nanostructures

ChemPhysChem ◽  
2011 ◽  
Vol 13 (4) ◽  
pp. 927-929 ◽  
Author(s):  
Miriam Böhmler ◽  
Achim Hartschuh
Keyword(s):  
Optical Microscopy ◽  
Near Field

scholarly journals Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

APL Photonics ◽  
2021 ◽  
Vol 6 (3) ◽  
pp. 036102
Author(s):  
Tobias Nörenberg ◽  
Lukas Wehmeier ◽  
Denny Lang ◽  
Susanne C. Kehr ◽  
Lukas M. Eng
Keyword(s):  
Optical Microscopy ◽  
Near Field

Gold-coated parabolic tapers for scanning near-field optical microscopy: fabrication and optimisation

1995 ◽  
Vol 61 (1-4) ◽  
pp. 155-163 ◽  
Author(s):  
Maria Garcia-Parajo ◽  
Tom Tate ◽  
Yong Chen
Keyword(s):  
Optical Microscopy ◽  
Near Field
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