scholarly journals Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

APL Photonics ◽  
2021 ◽  
Vol 6 (3) ◽  
pp. 036102
Author(s):  
Tobias Nörenberg ◽  
Lukas Wehmeier ◽  
Denny Lang ◽  
Susanne C. Kehr ◽  
Lukas M. Eng
Keyword(s):  
Optical Microscopy ◽  
Near Field

Tip-Enhanced Near-Field Optical Microscopy of Quasi-1 D Nanostructures

ChemPhysChem ◽  
2011 ◽  
Vol 13 (4) ◽  
pp. 927-929 ◽  
Author(s):  
Miriam Böhmler ◽  
Achim Hartschuh
Keyword(s):  
Optical Microscopy ◽  
Near Field

Gold-coated parabolic tapers for scanning near-field optical microscopy: fabrication and optimisation

1995 ◽  
Vol 61 (1-4) ◽  
pp. 155-163 ◽  
Author(s):  
Maria Garcia-Parajo ◽  
Tom Tate ◽  
Yong Chen
Keyword(s):  
Optical Microscopy ◽  
Near Field

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

scholarly journals Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Nano Letters ◽  
2013 ◽  
Vol 13 (7) ◽  
pp. 3152-3156 ◽  
Author(s):  
Julia Tisler ◽  
Thomas Oeckinghaus ◽  
Rainer J. Stöhr ◽  
Roman Kolesov ◽  
Rolf Reuter ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Defect Center ◽  
Single Defect
Sign in / Sign up

Export Citation Format

Share Document