Epitaxial layer thickness measurement of double heterostructures using reflectance spectroscopy

1990 ◽  
Vol 68 (6) ◽  
pp. 2927-2938 ◽  
Author(s):  
L. E. Tarof ◽  
C. J. Miner ◽  
C. Blaauw
Keyword(s):  
Layer Thickness ◽  
Epitaxial Layer ◽  
Reflectance Spectroscopy ◽  
Thickness Measurement ◽  
Double Heterostructures

Epitaxial layer thickness measurement by cross‐sectional atomic force microscopy

1996 ◽  
Vol 68 (23) ◽  
pp. 3353-3355 ◽  
Author(s):  
A. J. Howard ◽  
O. Blum ◽  
H. Chui ◽  
A. G. Baca ◽  
M. H. Crawford
Keyword(s):  
Atomic Force Microscopy ◽  
Layer Thickness ◽  
Epitaxial Layer ◽  
Thickness Measurement ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Atomic Force

Epitaxial Layer Thickness Measurement by Far Infrared Ellipsometry

1972 ◽  
Vol 11 (11) ◽  
pp. 2534 ◽  
Author(s):  
R. O. DeNicola ◽  
M. A. Saifi ◽  
R. E. Frazee
Keyword(s):  
Layer Thickness ◽  
Epitaxial Layer ◽  
Far Infrared ◽  
Thickness Measurement ◽  
Infrared Ellipsometry

Macular ganglion cell-Inner plexiform layer thickness measurement and reproducibility with SD-OCT

2012 ◽  
Vol 90 ◽  
pp. 0-0
Author(s):  
M FRANCOZ ◽  
J FENOLLAND ◽  
JM GIRAUD ◽  
H EL CHEHAB ◽  
D SENDON ◽  
...  
Keyword(s):  
Ganglion Cell ◽  
Layer Thickness ◽  
Plexiform Layer ◽  
Thickness Measurement ◽  
Inner Plexiform Layer ◽  
Sd Oct
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