Active Layer Thickness Measurement System For Double Heterostructure Laser Wafers

1989 ◽  
Vol 28 (1) ◽  
Author(s):  
Yoshinori Nakano ◽  
Nobuyori Tsuzuki
Keyword(s):  
Layer Thickness ◽  
Active Layer ◽  
Measurement System ◽  
Thickness Measurement ◽  
Active Layer Thickness ◽  
Double Heterostructure ◽  
Heterostructure Laser ◽  
Thickness Measurement System

NUMERICAL SIMULATION OF OPTICAL CONFINEMENT IN ZnO BASED HETEROSTRUCTURES AT 375-NANOMETER WAVELENGTH

2008 ◽  
Vol 22 (12) ◽  
pp. 1985-1995 ◽  
Author(s):  
M. P. BHOLE ◽  
E. P. SAMUEL ◽  
D. S. PATIL
Keyword(s):  
Numerical Simulation ◽  
Layer Thickness ◽  
Mole Fraction ◽  
Active Layer ◽  
Active Layer Thickness ◽  
Optical Confinement ◽  
Double Heterostructure ◽  
Active Layers ◽  
Junction Plane ◽  
Different Thickness

Numerical simulation of optical confinement in simple double heterostructure of ZnO / Mg x Zn 1-x O and hybrid double heterostructure of Al x Ga 1-x N/ZnO have been carried out at 375 nanometer wavelength using MATLAB. Field distribution along the junction plane has been studied as a function of mole fractions of Mg and Al for different thickness of active layers. The spread of field has been estimated as a function of mole fractions and articulated as Full Width at Half Maximum (FWHM). It was found to be decreasing nonlinearly with increase of Mg mole fraction in simple heterostructure and increasing in a nonlinear manner with increase of Al mole fraction in hybrid heterostructure. FWHM deduced from our analysis was 0.265 micron for 9% and 0.16 micron for 30% Mg mole fraction. For hybrid heterostructure, FWHM values estimated were 0.13 micron and 0.1475 micron for corresponding Al mole fraction values of 9% and 30%, respectively. The narrower confinement of field intensity around the center of the active layer for the higher values of Mg mole fraction has been attributed to an increase of refractive index step between active and barrier layers. The confinement factor as a function of mole fractions and active layer thickness has been explored, and it was found to be increasing with active layer thickness. Our analysis explores the optical confinement of mode 0 in simple and hybrid heterostructures of ZnO .

scholarly journals Permafrost temperature and active-layer thickness of Yakutia with 0.5-degree spatial resolution for model evaluation

2013 ◽  
Vol 5 (2) ◽  
pp. 305-310 ◽  
Author(s):  
C. Beer ◽  
A. N. Fedorov ◽  
Y. Torgovkin
Keyword(s):  
Layer Thickness ◽  
Spatial Resolution ◽  
Active Layer ◽  
Land Surface ◽  
Grid Cell ◽  
Active Layer Thickness ◽  
East Siberia ◽  
Permafrost Temperature ◽  
Surface Models ◽  
The Mean

Abstract. Based on the map of landscapes and permafrost conditions in Yakutia (Merzlotno-landshaftnaya karta Yakutskoi0 ASSR, Gosgeodeziya SSSR, 1991), rasterized maps of permafrost temperature and active-layer thickness of Yakutia, East Siberia were derived. The mean and standard deviation at 0.5-degree grid cell size are estimated by assigning a probability density function at 0.001-degree spatial resolution. The gridded datasets can be accessed at the PANGAEA repository (doi:10.1594/PANGAEA.808240). Spatial pattern of both variables are dominated by a climatic gradient from north to south, and by mountains and the soil type distribution. Uncertainties are highest in mountains and in the sporadic permafrost zone in the south. The maps are best suited as a benchmark for land surface models which include a permafrost module.

Optical non-contact micrometer thickness measurement system for silica thick films

2012 ◽  
Author(s):  
K. Thambiratnam ◽  
H. Ahmad ◽  
M. Yasin ◽  
A. Z. Zulkifli ◽  
S. W. Harun
Keyword(s):  
Measurement System ◽  
Thick Films ◽  
Thickness Measurement ◽  
Thickness Measurement System
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