Construction of a New VUV∕Soft X-ray Undulator Beamline BL-13A in the Photon Factory for Study of Organic Thin Films and Biomolecules Adsorbed on Surfaces

2010 ◽  
Author(s):  
Kazuhiko Mase ◽  
Akio Toyoshima ◽  
Takashi Kikuchi ◽  
Hirokazu Tanaka ◽  
Kenta Amemiya ◽  
...  
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray ◽  
Photon Factory

scholarly journals Boosting Direct X‐Ray Detection in Organic Thin Films by Small Molecules Tailoring

2018 ◽  
Vol 29 (21) ◽  
pp. 1806119 ◽  
Author(s):  
Andrea Ciavatti ◽  
Laura Basiricò ◽  
Ilaria Fratelli ◽  
Stefano Lai ◽  
Piero Cosseddu ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Molecules ◽  
Organic Thin Films ◽  
X Ray

scholarly journals 3D-structural Analysis of Epitaxially-grown Organic Thin Films by a Newly Developed Energy Dispersive X-ray Diffraction System.

Hyomen Kagaku ◽  
1998 ◽  
Vol 19 (4) ◽  
pp. 259-264
Author(s):  
Kenji ISHIDA ◽  
Toshihisa HORIUCHI ◽  
Kazumi MATSUSHIGE MATSUSHIGE
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Organic Thin Films ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray

Determination of dopant concentration in co-deposited organic thin films by using RBS and X-ray fluorescence combined techniques

2013 ◽  
Vol 35 (12) ◽  
pp. 2440-2443 ◽  
Author(s):  
Y.A. Paredes ◽  
E.G. Gravina ◽  
M.D. Barbosa ◽  
R. Machado ◽  
W.G. Quirino ◽  
...  
Keyword(s):  
Thin Films ◽  
Dopant Concentration ◽  
Organic Thin Films ◽  
X Ray

scholarly journals Resonant soft x-ray reflectivity of organic thin films

2007 ◽  
Vol 25 (3) ◽  
pp. 575-586 ◽  
Author(s):  
Cheng Wang ◽  
Tohru Araki ◽  
Benjamin Watts ◽  
Shane Harton ◽  
Tadanori Koga ◽  
...  
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray

X-ray Induced Modification of Semifluorinated Organic Thin Films†

2000 ◽  
Vol 104 (14) ◽  
pp. 3291-3297 ◽  
Author(s):  
Anthony J. Wagner ◽  
Keping Han ◽  
Amanda L. Vaught ◽  
D. Howard Fairbrother
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
X Ray

Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate

1995 ◽  
Vol 39 ◽  
pp. 659-664 ◽  
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Shoichi Kal ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Film Studies ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Evaluation ◽  
Crystalline Substrate ◽  
Scattering Volume

Thin film technology is rapidly evolving today, and the characterization of the thin film and its surface have become very important issue not only from scientific but also technological viewpoints. Although x-ray diffraction measurements have been used as suitable evaluation methods in crystallography studies, its application to the structural evaluation of the thin films, especially organic one having the low electron densities, is not easy due to the small amounts of scattering volume and the high obstructive scattering noise from the substrate. However, the x-ray diffraction measurements under grazing incidence will aid not only in overcoming the such problems but also in analyzing in-plane structure of the thin films. Therefore, so-called grazing incidence x-ray diffraction (GIXD) has been recognized as one of the most powerful tools for the surface and thin film studies.

Radical Reactions with Organic Thin Films:  Chemical Interaction of Atomic Oxygen with an X-ray Modified Self-Assembled Monolayer

2002 ◽  
Vol 106 (24) ◽  
pp. 6265-6272 ◽  
Author(s):  
Jessica Torres ◽  
Christopher C. Perry ◽  
Stephen J. Bransfield ◽  
D. Howard Fairbrother
Keyword(s):  
Thin Films ◽  
Atomic Oxygen ◽  
Chemical Interaction ◽  
Organic Thin Films ◽  
Radical Reactions ◽  
Self Assembled Monolayer ◽  
X Ray ◽  
Self Assembled
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