Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy

S. Inamoto; J. Yamasaki; E. Okunishi; K. Kakushima; H. Iwai; N. Tanaka

doi:10.1063/1.3445874

Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy

Journal of Applied Physics ◽

10.1063/1.3445874 ◽

2010 ◽

Vol 107 (12) ◽

pp. 124510 ◽

Cited By ~ 9

Author(s):

S. Inamoto ◽

J. Yamasaki ◽

E. Okunishi ◽

K. Kakushima ◽

H. Iwai ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Lanthanum Oxide ◽

Transmission Electron ◽

High K ◽

Scanning Transmission ◽

Annealing Effects ◽

Electron Energy Loss ◽

Aberration Corrected

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Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.3139/146.110244 ◽

2010 ◽

Vol 101 (1) ◽

pp. 21-26 ◽

Cited By ~ 5

Author(s):

Maria Varela ◽

Jaume Gazquez ◽

Andy R. Lupini ◽

Julia T. Luck ◽

Maria A. Torija ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Energy Loss ◽

Electron Energy Loss Spectroscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Thin Oxide Films ◽

Electron Energy Loss ◽

Aberration Corrected

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Atomic-Resolution Electron Energy Loss Spectroscopy Imaging in Aberration Corrected Scanning Transmission Electron Microscopy

Physical Review Letters ◽

10.1103/physrevlett.91.105503 ◽

2003 ◽

Vol 91 (10) ◽

Cited By ~ 84

Author(s):

L. J. Allen ◽

S. D. Findlay ◽

A. R. Lupini ◽

M. P. Oxley ◽

S. J. Pennycook

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Energy Loss ◽

Scanning Transmission Electron Microscopy ◽

Atomic Resolution ◽

Transmission Electron ◽

Resolution Electron ◽

Scanning Transmission ◽

Electron Energy Loss ◽

Aberration Corrected

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Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures

Journal of Materials Science ◽

10.1007/s10853-011-5248-7 ◽

2011 ◽

Vol 46 (12) ◽

pp. 4157-4161 ◽

Cited By ~ 2

Author(s):

Jaume Gazquez ◽

Maria Varela ◽

Daniela Petti ◽

Matteo Cantoni ◽

Christian Rinaldi ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Energy Loss ◽

Electron Energy Loss Spectroscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Spectroscopy Studies ◽

Electron Energy Loss ◽

Aberration Corrected

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Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy

Micron ◽

10.1016/j.micron.2010.12.008 ◽

2011 ◽

Vol 42 (6) ◽

pp. 539-546 ◽

Cited By ~ 12

Author(s):

A.B. Shah ◽

Q.M. Ramasse ◽

J.G. Wen ◽

A. Bhattacharya ◽

J.M. Zuo

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Energy Loss ◽

Spatial Resolution ◽

Electron Energy Loss Spectroscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Energy Loss ◽

Aberration Corrected

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Application of aberration‐corrected scanning transmission electron microscopy in conjunction with valence electron energy loss spectroscopy for the nanoscale mapping of the elastic properties of Al–Li–Cu alloys

Microscopy Research and Technique ◽

10.1002/jemt.23646 ◽

2020 ◽

Author(s):

Muna S. Khushaim ◽

Dalaver H. Anjum

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Energy Loss ◽

Scanning Transmission Electron Microscopy ◽

Valence Electron ◽

Cu Alloys ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Energy Loss ◽

Aberration Corrected

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Electrochemical Degradation of Pt–Ni Nanocatalysts: An Identical Location Aberration-Corrected Scanning Transmission Electron Microscopy Study

Nano Letters ◽

10.1021/acs.nanolett.8b03022 ◽

2018 ◽

Vol 19 (1) ◽

pp. 46-53 ◽

Cited By ~ 6

Author(s):

Somaye Rasouli ◽

Deborah Myers ◽

Nancy Kariuki ◽

Kenji Higashida ◽

Naotoshi Nakashima ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Electrochemical Degradation ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Wavelet image analysis in aberration-corrected scanning transmission electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-84 ◽

2004 ◽

pp. 355-358

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Image Analysis ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet Image ◽

Aberration Corrected

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Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy

Micron ◽

10.1016/j.micron.2012.04.018 ◽

2012 ◽

Vol 43 (10) ◽

pp. 1068-1072 ◽

Cited By ~ 1

Author(s):

Paul D. Robb ◽

Michael Finnie ◽

Alan J. Craven

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Short Period ◽

Scanning Transmission ◽

Short Period Superlattices ◽

Aberration Corrected

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Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Advances in Imaging and Electron Physics - Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy ◽

10.1016/s1076-5670(08)01008-2 ◽

2008 ◽

pp. 283-325 ◽

Cited By ~ 3

Author(s):

Angus I. Kirkland ◽

Peter D. Nellist ◽

Lan-Yun Chang ◽

Sarah J. Haigh

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Conventional Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Tracking oxidation of individual iron nanoparticles with atomic resolution using aberration-corrected environmental in situ scanning transmission electron microscopy

10.22443/rms.emc2020.1388 ◽

2021 ◽

Author(s):

Roland Kröger ◽

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Iron Nanoparticles ◽

Atomic Resolution ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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