Electron Microscopy and Analysis 2003
Latest Publications

TOTAL DOCUMENTS

112

(FIVE YEARS 0)

H-INDEX

0

(FIVE YEARS 0)

Published By CRC Press

9780429076602

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Size dependence of the contact angle of Bi liquid clusters supported on SiO

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-96 ◽

2004 ◽

pp. 407-410

Keyword(s):

Contact Angle ◽

Size Dependence ◽

Liquid Clusters

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Improved visibility of thin amorphous intergranular films using Fourier filtering

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-87 ◽

2004 ◽

pp. 367-370

Keyword(s):

Intergranular Films ◽

Fourier Filtering

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Wavelet image analysis in aberration-corrected scanning transmission electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-84 ◽

2004 ◽

pp. 355-358

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Image Analysis ◽

Scanning Transmission Electron Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Wavelet Image ◽

Aberration Corrected

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The effect of radiation damage on anomalous absorption in the TEM

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-77 ◽

2004 ◽

pp. 325-328

Keyword(s):

Radiation Damage ◽

Anomalous Absorption

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Spectrum imaging of high-k dielectric stacks

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-74 ◽

2004 ◽

pp. 313-316

Keyword(s):

High K ◽

Spectrum Imaging ◽

High K Dielectric

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Microstructural observation of overload effect on the fatigue crack growth of 2024-T3 Al-alloy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-70 ◽

2004 ◽

pp. 295-298

Keyword(s):

Fatigue Crack ◽

Fatigue Crack Growth ◽

Crack Growth ◽

Al Alloy ◽

Microstructural Observation

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Phosphorus segregation and intergranular embrittlement in 2.25Cr1Mo steel

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-67 ◽

2004 ◽

pp. 283-286

Keyword(s):

Phosphorus Segregation ◽

Intergranular Embrittlement

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Regression methods for image distortion of 3-D scanning electron microscopy

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-52 ◽

2004 ◽

pp. 221-224

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Image Distortion ◽

Regression Methods ◽

Scanning Electron

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Chromatic aberrations of electrostatic lens doublets

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-48 ◽

2004 ◽

pp. 205-208

Keyword(s):

Electrostatic Lens ◽

Chromatic Aberrations

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Can Ronchigrams provide a route to sub-angstrom tomographic reconstruction?

Electron Microscopy and Analysis 2003 ◽

10.1201/9781482269130-47 ◽

2004 ◽

pp. 199-204

Keyword(s):

Tomographic Reconstruction

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