The effect of rare-earth clustering on charge trapping and electroluminescence in rare-earth implanted metal-oxide-semiconductor light-emitting devices

2010 ◽  
Vol 107 (12) ◽  
pp. 123112 ◽  
Author(s):  
A. N. Nazarov ◽  
S. I. Tiagulskyi ◽  
I. P. Tyagulskyy ◽  
V. S. Lysenko ◽  
L. Rebohle ◽  
...  
Keyword(s):  
Rare Earth ◽  
Metal Oxide ◽  
Charge Trapping ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Light Emitting ◽  
Light Emitting Devices

scholarly journals Application prospect of metal-oxide-semiconductor silicon light emitting devices in integrated circuits

2019 ◽  
Vol 68 (16) ◽  
pp. 167803
Author(s):  
Ning Zhang ◽  
Kai-Kai Xu ◽  
Yan-Xu Chen ◽  
Kun-Feng Zhu ◽  
Jian-Ming Zhao ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Light Emitting ◽  
Light Emitting Devices ◽  
Semiconductor Silicon

Charge trapping behaviour in deposited and grown thin metal-oxide-semiconductor gate dielectrics

1997 ◽  
Vol 296 (1-2) ◽  
pp. 37-40 ◽  
Author(s):  
V. Ramgopal Rao ◽  
W. Hansch ◽  
H. Baumgärtner ◽  
I. Eisele ◽  
D.K. Sharma ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Gate Dielectrics ◽  
Charge Trapping ◽  
Metal Oxide Semiconductor ◽  
Thin Metal ◽  
Oxide Semiconductor
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