Low frequency and microwave characterization of submicron‐gate In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As heterojunction metal‐semiconductor field‐effect transistors grown by molecular‐beam epitaxy
1988 ◽
Vol 35
(12)
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pp. 2449-2450
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2012 ◽
Vol 51
(6S)
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pp. 06FE18
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Keyword(s):
Keyword(s):
2007 ◽
Vol 46
(4B)
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pp. 2117-2121
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