Si (111) surface cleaning using atomic hydrogen and SiH2studied using reflection high‐energy electron diffraction
Keyword(s):
2000 ◽
Vol 18
(3)
◽
pp. 951-955
◽
2001 ◽
Vol 10
(3-7)
◽
pp. 1218-1223
◽
Keyword(s):
1998 ◽
Vol 16
(2)
◽
pp. 749-753
◽
Keyword(s):
1990 ◽
Vol 48
(2)
◽
pp. 396-397
1998 ◽
Vol 37
(Part 2, No. 2A)
◽
pp. L164-L166
◽
Keyword(s):
1997 ◽
Vol 15
(3)
◽
pp. 911-914
◽
1994 ◽
Vol 33
(Part 2, No. 1A)
◽
pp. L1-L4
◽
Keyword(s):
1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
◽