scholarly journals NUMERICAL SIMULATION OF TEMPERATURE SENSOR SELF-HEATING EFFECTS IN GASEOUS AND LIQUID HYDROGEN UNDER CRYOGENIC CONDITIONS

2010 ◽  
Author(s):  
R. Langebach ◽  
Ch. Haberstroh ◽  
J. G. Weisend
2015 ◽  
Vol 212 (5) ◽  
pp. 1130-1136 ◽  
Author(s):  
Raúl Rodríguez ◽  
Benito González ◽  
Javier García ◽  
Fetene M. Yigletu ◽  
José M. Tirado ◽  
...  

2012 ◽  
Vol 11 (1) ◽  
pp. 106-117 ◽  
Author(s):  
K. Raleva ◽  
D. Vasileska ◽  
A. Hossain ◽  
S.-K. Yoo ◽  
S. M. Goodnick
Keyword(s):  

1995 ◽  
Vol 10 (4) ◽  
pp. 515-522 ◽  
Author(s):  
M De Murcia ◽  
E Richard ◽  
J M Perraudin ◽  
A Boyer ◽  
A Benvenuti ◽  
...  

2017 ◽  
Vol 137 ◽  
pp. 123-127
Author(s):  
Ilho Myeong ◽  
Dokyun Son ◽  
Hyunsuk Kim ◽  
Myounggon Kang ◽  
Hyungcheol Shin

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
R. A. Sporea ◽  
T. Burridge ◽  
S. R. P. Silva
Keyword(s):  

2017 ◽  
Vol 64 (11) ◽  
pp. 4393-4399 ◽  
Author(s):  
Jun-Young Park ◽  
Byung-Hyun Lee ◽  
Ki Soo Chang ◽  
Dong Uk Kim ◽  
Chanbae Jeong ◽  
...  

1995 ◽  
Vol 379 ◽  
Author(s):  
Jeffrey J. Welser

ABSTRACTThe experimental application of strained-Si / relaxed-Si1−xGex heterostructures to n-MOSFETs is discussed, focusing on the enhanced mobility provided by the strain. This paper provides an overview of the theoretically-predicted electronic properties of these heterostructures, as well as their growth. Several practical issues which arise in MOS applications are covered, including the effect of the relaxed-Si1−xGex, buffer layers on diode performance, and the observation of self-heating effects in the output characteristics of the MOS transistors.


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