Blocking hillock and whisker growth by intermetallic compound formation in Sn-0.7Cu flip chip solder joints under electromigration

2010 ◽  
Vol 107 (9) ◽  
pp. 093715 ◽  
Author(s):  
S. W. Liang ◽  
Chih Chen ◽  
J. K. Han ◽  
Luhua Xu ◽  
K. N. Tu ◽  
...  
2006 ◽  
Vol 35 (5) ◽  
pp. 897-904 ◽  
Author(s):  
Yanghua Xia ◽  
Chuanyan Lu ◽  
Junling Chang ◽  
Xiaoming Xie

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