scholarly journals Residual strain gradients in a fully stabilized zirconia sample

1988 ◽  
Vol 63 (11) ◽  
pp. 5351-5356 ◽  
Author(s):  
Bing Hwang ◽  
C. R. Houska ◽  
G. E. Ice ◽  
A. Habenschuss
Keyword(s):  
Residual Strain ◽  
Stabilized Zirconia ◽  
Strain Gradients ◽  
Zirconia Sample

Size-Strain and Quantitative Phase Analysis by the Rietveld Method

1991 ◽  
Vol 35 (A) ◽  
pp. 69-76 ◽  
Author(s):  
Paolo Scardi ◽  
Luca Lutterotti ◽  
Rosa Di Maggio
Keyword(s):  
Crystallite Size ◽  
Phase Analysis ◽  
Binary Mixtures ◽  
Rietveld Method ◽  
Quantitative Phase Analysis ◽  
Stabilized Zirconia ◽  
Quantitative Phase ◽  
Zirconia Sample ◽  
Peak Broadening ◽  
Conventional Methods

AbstractA modified version of the Rietveld method has been developed for quantitative phase analysis in conjunction with crystallite size and microstrain determination.Besides the information on the microstructural disorder in the different phases present in the sample, accurate phase analysis can be performed, even in presence of anisotropic crystallites, taking into account the non-instrumental peak broadening effect in a better way compared to conventional methods.The method has been tested on binary mixtures of corundum, ceria stabilized zirconia and on a polyphase stabilized zirconia sample.

Novel yttrium-stabilized zirconia polymeric precursor for the fabrication of thin films

2004 ◽  
Vol 19 (9) ◽  
pp. 2708-2713 ◽  
Author(s):  
Roger M. Smith ◽  
Xiao-Dong Zhou ◽  
Wayne Huebner ◽  
Harlan U. Anderson
Keyword(s):  
Thin Films ◽  
Activation Energy ◽  
Grain Growth ◽  
Residual Strain ◽  
Annealing Temperature ◽  
Arrhenius Equation ◽  
Polymeric Precursor ◽  
Ambient Conditions ◽  
Stabilized Zirconia ◽  
Free Films

An acetate-based polymeric precursor for producing yttrium-stabilized zirconia (YSZ) was developed. The precursor was prepared under ambient conditions and contains only yttrium and zirconium cations. Dense, crack-free films were fabricated with this precursor on alumina substrates at a rate of 60 nm per deposition, producing polycrystalline YSZ at temperatures as low as 600 °C. Grain growth in thin YSZ films followed Arrhenius equation with an activation energy approximately 0.45 eV. The residual strain in YSZ films decreased with increasing annealing temperature from 600 to 900 °C.

Effect of thermal annealing on grain boundary chemistry of polycrystalline TiBa2Ca2Cu3Oy films

1994 ◽  
Vol 52 ◽  
pp. 968-969
Author(s):  
Z. L. Wang ◽  
C. L. Briant ◽  
J. DeLuca ◽  
A. Goyal ◽  
D. M. Kroeger ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Weak Link ◽  
Zero Field ◽  
Stabilized Zirconia ◽  
Local Texture ◽  
Transmission Electron ◽  
Axis Alignment ◽  
Boundary Chemistry ◽  
Small Misorientation ◽  
Misorientation Angles

Recent studies have shown that spray-pyrolyzed films of the Tl-1223 compound (TlxBa2Ca2Cu3Oy, with 0.7 < × < 0.95) on polycrystalline yttrium stabilized zirconia substrates can be prepared which have critical current density Jc near 105 A/cm2 at 77 K, in zero field. The films are polycrystalline, have excellent c-axis alignment, and show little evidence of weak-link behavior. Transmission electron microscopy (TEM) studies have shown that most grain boundaries have small misorientation angles. It has been found that the films have a nigh degree of local texture indicative of colonies of similarly oriented grains. It is believed that inter-colony conduction is enhanced by a percolative network of small angle boundaries at colony interfaces. It has also been found that Jc is increased by a factor of 4 - 5 after the films were annealed at 600 °C in oxygen. This study is thus carried out to determine the effect on grain boundary chemistry of the heat treatment.

Microstructural examination of modified yttria stabilized zirconia by EM analytical techniques

1986 ◽  
Vol 44 ◽  
pp. 842-843
Author(s):  
W. W. Davison ◽  
R. C. Buchanan
Keyword(s):  
Mechanical Properties ◽  
Analytical Techniques ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Transmission Microscopy ◽  
Sintering Aid ◽  
Densification Temperature ◽  
Chemical Inertness ◽  
Scanning Transmission ◽  
Microstructural Examination

Yttria stabilized zirconia (YSZ) has become a significant technological material due to its high ionic conductivity, chemical inertness, and good mechanical properties. Temperatures on the order of 1700°C are required, however, to densify YSZ to the degree necessary for good electrical and mechanical properties. A technique for lowering the densification temperature is the addition of small amounts of material which facilitate the formation of a liquid phase at comparatively low temperatures. In this study, sintered microstructures obtained from the use of Al2O3 as a sintering aid were examined with scanning, transmission, and scanning transmission microscopy (SEM, TEM, and STEM).

Characterizations of Synthetic 8mol% YSZ with Comparison to 3mol %YSZ for HT-SOFC

2020 ◽  
Vol 38 (4A) ◽  
pp. 491-500
Author(s):  
Abeer F. Al-Attar ◽  
Saad B. H. Farid ◽  
Fadhil A. Hashim
Keyword(s):  
Ionic Conductivity ◽  
Electrochemical Impedance ◽  
Structural Information ◽  
Impedance Analysis ◽  
High Energy ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Powder Morphology ◽  
X Ray

In this work, Yttria (Y2O3) was successfully doped into tetragonal 3mol% yttria stabilized Zirconia (3YSZ) by high energy-mechanical milling to synthesize 8mol% yttria stabilized Zirconia (8YSZ) used as an electrolyte for high temperature solid oxide fuel cells (HT-SOFC). This work aims to evaluate the densification and ionic conductivity of the sintered electrolytes at 1650°C. The bulk density was measured according to ASTM C373-17. The powder morphology and the microstructure of the sintered electrolytes were analyzed via Field Emission Scanning Electron Microscopy (FESEM). The chemical analysis was obtained with Energy-dispersive X-ray spectroscopy (EDS). Also, X-ray diffraction (XRD) was used to obtain structural information of the starting materials and the sintered electrolytes. The ionic conductivity was obtained through electrochemical impedance spectroscopy (EIS) in the air as a function of temperatures at a frequency range of 100(mHz)-100(kHz). It is found that the 3YSZ has a higher density than the 8YSZ. The impedance analysis showed that the ionic conductivity of the prepared 8YSZ at 800°C is0.906 (S.cm) and it was 0.214(S.cm) of the 3YSZ. Besides, 8YSZ has a lower activation energy 0.774(eV) than that of the 3YSZ 0.901(eV). Thus, the prepared 8YSZ can be nominated as an electrolyte for the HT-SOFC.

Preparation of Magnesia Stabilized Zirconia Thin Films for Solid Oxide Fuel Cell by Microwave Plasma Chemical Vapor Deposition.

Shinku ◽  
1997 ◽  
Vol 40 (8) ◽  
pp. 660-663
Author(s):  
Hideo OKAYAMA ◽  
Tsukasa KUBO ◽  
Noritaka MOCHIZUKI ◽  
Akiyoshi NAGATA ◽  
Hiromu ISA
Keyword(s):  
Thin Films ◽  
Fuel Cell ◽  
Vapor Deposition ◽  
Microwave Plasma ◽  
Chemical Vapor ◽  
Solid Oxide ◽  
Oxide Fuel ◽  
Stabilized Zirconia ◽  
Plasma Chemical ◽  
Plasma Chemical Vapor Deposition

Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy

2004 ◽  
Vol 95 (5) ◽  
pp. 340-344 ◽  
Author(s):  
P. Dobrosz ◽  
S. J. Bull ◽  
S. H. Olsen ◽  
A. G. O'Neill
Keyword(s):  
Raman Spectroscopy ◽  
Residual Strain ◽  
Strained Si

Maximum Temperature Through a Yttrium Stabilized Zirconia Ceramic After Er,Cr:YSGG Laser Irradiation

2020 ◽  
Vol 02 ◽  
Author(s):  
Laurel Stringer ◽  
Sarah Malley ◽  
Darrell M. Hutto ◽  
Jason A. Griggs ◽  
Susana M. Salazar Marocho
Keyword(s):  
High Speed ◽  
Potential Method ◽  
Maximum Temperature ◽  
Zirconia Ceramic ◽  
Tooth Pulp ◽  
Control Group ◽  
Stabilized Zirconia ◽  
Significant Difference ◽  
Power Setting ◽  
Group A

Background: The most common approach to remove yttria stabilized zirconia (YSZ) fixed-dental prostheses (FDPs) is by means of diamond burs attached to a high-speed handpiece. This process is time-consuming and destructive. The use of lasers over mechanical instrumentation for removal of FDPs can lead to efficient and predictable restoration retrievability. However, the heat produced might damage the tooth pulp (>42˚C). Objective: The purpose of this study was to determine the maximum temperature (T) reached during the use of different settings of the erbium, chromium:yttrium-scandium-gallium-garnet Er,Cr:YSGG laser through a YSZ ceramic. Methods: YSZ slices (1 mm thick) were assigned into 7 groups. For the control group, a diamond bur was used to cut a 1 mm groove into the YSZ slices. For the 6 experimental groups, the laser was operated at a constant combination of 33% water and 66% air during 30 s with two different power settings (W) at three frequencies (PPS), as follows (W/PPS): 2.5/20, 2.5/30, 2.5/45, 4.5/20, 4.5/30, 4.5/45. The T through the YSZ slice was recorded in degrees Celsius by using a digital thermometer with a K thermocouple. Results: The median T of the control group was 26.5˚C. The use of 4.5 W resulted in the median T (˚C) of 44.2 at 20 PPS, 53.3 at 30 PPS, and 58.9 at 45 PPS, while 2.5 W showed 34.6, 31.6, and 25.0 at 20, 30, and 45 PPS, respectively. KruskalWallis one-way ANOVA showed that within each power setting, the T was similar. The high power and lowest frequency (4.5/20) showed no significant difference from the 2.5 W settings and the control group. Conclusion: The lower power setting (2.5 W) is a potential method for the use of the Er,Cr:YSGG laser to debond YSZ structures. The higher power (4.5 W) with high frequencies (30 and 45 PPS) is unsuitable.

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