Rutherford backscattering and transmission electron microscopy study on phase transformation of As heavily doped Si during post‐rapid‐thermal annealing

Zhiheng Lu

doi:10.1063/1.339853

Rutherford backscattering and transmission electron microscopy study on phase transformation of As heavily doped Si during post‐rapid‐thermal annealing

Journal of Applied Physics ◽

10.1063/1.339853 ◽

1987 ◽

Vol 62 (5) ◽

pp. 1756-1760 ◽

Cited By ~ 3

Author(s):

Zhiheng Lu

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Thermal Annealing ◽

Rapid Thermal Annealing ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Heavily Doped

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A transmission electron microscopy study of the effect of the ? ? ? phase transformation of tin on xenon bubbles formed by ion implantation

Journal of Materials Science Letters ◽

10.1007/bf00724777 ◽

1991 ◽

Vol 10 (15) ◽

pp. 905-907 ◽

Cited By ~ 4

Author(s):

D. R. G. Mitchell ◽

S. E. Donnelly

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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200 eV–10 keV boron implantation and rapid thermal annealing: Secondary ion mass spectroscopy and transmission electron microscopy study

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589805 ◽

1998 ◽

Vol 16 (1) ◽

pp. 327 ◽

Cited By ~ 17

Author(s):

M. I. Current

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Rapid Thermal Annealing ◽

Mass Spectroscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Boron Implantation ◽

Secondary Ion

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A transmission electron microscopy study of the β→α-phase transformation of tin

Philosophical Magazine A ◽

10.1080/01418619108213911 ◽

1991 ◽

Vol 63 (4) ◽

pp. 747-755 ◽

Cited By ~ 15

Author(s):

D. R. G. Mitchell ◽

S. E. Donnelly

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Α Phase ◽

Transmission Electron

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Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

Scripta Materialia ◽

10.1016/j.scriptamat.2009.01.023 ◽

2009 ◽

Vol 60 (9) ◽

pp. 799-802 ◽

Cited By ~ 2

Author(s):

Jonghan Won ◽

James A. Valdez ◽

Muneyuki Naito ◽

Manabu Ishimaru ◽

Kurt E. Sickafus

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Electron Beam ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Niobium Nitride ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Cited By ~ 2

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Cited By ~ 34

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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