scholarly journals Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

2009 ◽  
Vol 60 (9) ◽  
pp. 799-802 ◽  
Author(s):  
Jonghan Won ◽  
James A. Valdez ◽  
Muneyuki Naito ◽  
Manabu Ishimaru ◽  
Kurt E. Sickafus
Sign in / Sign up

Export Citation Format

Share Document