A transmission electron microscopy study of the effect of the ? ? ? phase transformation of tin on xenon bubbles formed by ion implantation

D. R. G. Mitchell; S. E. Donnelly

doi:10.1007/bf00724777

A transmission electron microscopy study of the effect of the ? ? ? phase transformation of tin on xenon bubbles formed by ion implantation

Journal of Materials Science Letters ◽

10.1007/bf00724777 ◽

1991 ◽

Vol 10 (15) ◽

pp. 905-907 ◽

Cited By ~ 4

Author(s):

D. R. G. Mitchell ◽

S. E. Donnelly

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of ion implantation induced Si amorphization

Nuclear Instruments and Methods in Physics Research ◽

10.1016/0167-5087(83)90822-0 ◽

1983 ◽

Vol 209-210 ◽

pp. 351-356 ◽

Cited By ~ 87

Author(s):

M.O. Ruault ◽

J. Chaumont ◽

H. Bernas

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Nucleation and growth of carbon onions synthesized by ion-implantation: a transmission electron microscopy study

Materials Letters ◽

10.1016/s0167-577x(01)00567-5 ◽

2002 ◽

Vol 54 (2-3) ◽

pp. 222-228 ◽

Cited By ~ 23

Author(s):

E Thune ◽

T Cabioc'h ◽

Ph Guérin ◽

M.-F Denanot ◽

M Jaouen

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Microscopy Study ◽

Nucleation And Growth ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Carbon Onions

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Synthesis of mesoporous amorphous silica by Kr and Xe ion implantation: Transmission electron microscopy study of induced nanostructures

Microporous and Mesoporous Materials ◽

10.1016/j.micromeso.2010.02.015 ◽

2010 ◽

Vol 132 (1-2) ◽

pp. 163-173 ◽

Cited By ~ 7

Author(s):

E. Oliviero ◽

M.-O. Ruault ◽

B. Décamps ◽

F. Fotuna ◽

E. Ntsoenzok ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Amorphous Silica ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Rutherford backscattering and transmission electron microscopy study on phase transformation of As heavily doped Si during post‐rapid‐thermal annealing

Journal of Applied Physics ◽

10.1063/1.339853 ◽

1987 ◽

Vol 62 (5) ◽

pp. 1756-1760 ◽

Cited By ~ 3

Author(s):

Zhiheng Lu

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Thermal Annealing ◽

Rapid Thermal Annealing ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Heavily Doped

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Transmission electron microscopy study of damage by ion implantation in gold Evidence for a spike threshold

Philosophical Magazine A ◽

10.1080/01418617908239305 ◽

1979 ◽

Vol 39 (6) ◽

pp. 757-783 ◽

Cited By ~ 23

Author(s):

M. O. Ruault ◽

H. Bernas ◽

J. Chaumont

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Spike Threshold ◽

Transmission Electron

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A transmission electron microscopy study of the β→α-phase transformation of tin

Philosophical Magazine A ◽

10.1080/01418619108213911 ◽

1991 ◽

Vol 63 (4) ◽

pp. 747-755 ◽

Cited By ~ 15

Author(s):

D. R. G. Mitchell ◽

S. E. Donnelly

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Α Phase ◽

Transmission Electron

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Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

Scripta Materialia ◽

10.1016/j.scriptamat.2009.01.023 ◽

2009 ◽

Vol 60 (9) ◽

pp. 799-802 ◽

Cited By ~ 2

Author(s):

Jonghan Won ◽

James A. Valdez ◽

Muneyuki Naito ◽

Manabu Ishimaru ◽

Kurt E. Sickafus

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Electron Beam ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Niobium Nitride ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Cited By ~ 2

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Cited By ~ 34

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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