Point‐defect generation during oxidation of silicon in dry oxygen. I. Theory

1986 ◽  
Vol 59 (7) ◽  
pp. 2541-2550 ◽  
Author(s):  
Scott T. Dunham ◽  
James D. Plummer
1976 ◽  
Vol 30 (3) ◽  
pp. 183-184
Author(s):  
J. S. Koehler

1981 ◽  
Vol 128 (5) ◽  
pp. 1121-1130 ◽  
Author(s):  
A. Miin‐Ron Lin ◽  
Robert W. Dutton ◽  
Dimitri A. Antoniadis ◽  
William A. Tiller

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