Characterization ofDXcenters in molecular‐beam‐epitaxial grown Si‐doped AlxGa1−xAs using Schottky barriers and modulation‐doped field‐effect transistors
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1993 ◽
Vol 127
(1-4)
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pp. 29-35
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1987 ◽
Vol 5
(3)
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pp. 785
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1986 ◽
Vol 4
(2)
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pp. 622
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2020 ◽
Vol 12
(16)
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pp. 18667-18673
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