Characterization ofDXcenters in molecular‐beam‐epitaxial grown Si‐doped AlxGa1−xAs using Schottky barriers and modulation‐doped field‐effect transistors

1985 ◽  
Vol 58 (2) ◽  
pp. 845-851 ◽  
Author(s):  
S. Subramanian ◽  
U. Schuller ◽  
J. R. Arthur
2020 ◽  
Vol 12 (16) ◽  
pp. 18667-18673 ◽  
Author(s):  
Gaurav Pande ◽  
Jyun-Yan Siao ◽  
Wei-Liang Chen ◽  
Chien-Ju Lee ◽  
Raman Sankar ◽  
...  

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