Oscillator strength of small‐polaron absorption in WOx(x≤3) electrochromic thin films

1985 ◽  
Vol 57 (3) ◽  
pp. 911-919 ◽  
Author(s):  
Tetsuzo Yoshimura
Keyword(s):  
Thin Films ◽  
Oscillator Strength ◽  
Small Polaron ◽  
Polaron Absorption

Small-polaron absorption in W x Mo1–x O3

1981 ◽  
Vol 43 (1) ◽  
pp. 105-114 ◽  
Author(s):  
E. Salje ◽  
G. Hoppmann
Keyword(s):  
Small Polaron ◽  
Polaron Absorption

High temperature Seebeck coefficient, small-polaron conduction and work function of LiMn1.5Ni0.5O4 thin films

2020 ◽  
Vol 53 (47) ◽  
pp. 475304
Author(s):  
Sruthy Subash ◽  
Vijay Vaiyapuri ◽  
M Navaneethan ◽  
Yuvaraj Sivalingam ◽  
K Kamala Bharathi
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Seebeck Coefficient ◽  
Work Function ◽  
Small Polaron ◽  
Polaron Conduction ◽  
Small Polaron Conduction

Growth and small polaron properties of epitaxial La1−xCaxMnO3 thin films

1998 ◽  
Vol 83 (11) ◽  
pp. 5913-5916 ◽  
Author(s):  
D. C. Worledge ◽  
L. Miéville ◽  
T. H. Geballe
Keyword(s):  
Thin Films ◽  
Small Polaron

Small polaron conduction in CoMnNiO amorphous thin films

Vacuum ◽  
1991 ◽  
Vol 42 (16) ◽  
pp. 1091-1092
Author(s):  
Tan Hui ◽  
Tao Mingde ◽  
Gin Dong ◽  
Han Ying
Keyword(s):  
Thin Films ◽  
Small Polaron ◽  
Amorphous Thin Films ◽  
Polaron Conduction ◽  
Small Polaron Conduction

Optical selection rule and oscillator strength of confined exciton system in CuCl thin films

1993 ◽  
Vol 71 (9) ◽  
pp. 1431-1434 ◽  
Author(s):  
Z. K. Tang ◽  
A. Yanase ◽  
T. Yasui ◽  
Y. Segawa ◽  
K. Cho
Keyword(s):  
Thin Films ◽  
Oscillator Strength ◽  
Selection Rule ◽  
Exciton System

Effect of epitaxial strain on small-polaron hopping conduction in Pr0.7(Ca0.6Sr0.4)0.3MnO3 thin films

2015 ◽  
Vol 106 (10) ◽  
pp. 102406 ◽  
Author(s):  
Jing Wang ◽  
Feng-xia Hu ◽  
Ying-ying Zhao ◽  
Yao Liu ◽  
Rong-rong Wu ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Polaron ◽  
Hopping Conduction ◽  
Polaron Hopping ◽  
Small Polaron Hopping ◽  
Epitaxial Strain

Charge Reorganization Energy and Small Polaron Binding Energy of Rubrene Thin Films by Ultraviolet Photoelectron Spectroscopy

2012 ◽  
Vol 24 (7) ◽  
pp. 901-905 ◽  
Author(s):  
Steffen Duhm ◽  
Qian Xin ◽  
Shunsuke Hosoumi ◽  
Hirohiko Fukagawa ◽  
Kazushi Sato ◽  
...  
Keyword(s):  
Thin Films ◽  
Binding Energy ◽  
Photoelectron Spectroscopy ◽  
Small Polaron ◽  
Reorganization Energy ◽  
Ultraviolet Photoelectron Spectroscopy

GROWTH AND CHARACTERISTIC OF AMORPHOUS NANO-GRANULAR TeO2–V2O5–NiO THIN FILMS

2016 ◽  
Vol 23 (02) ◽  
pp. 1550105 ◽  
Author(s):  
SH. HOSSEINZADEH ◽  
A. RAHMATI ◽  
H. BIDADI
Keyword(s):  
Thin Films ◽  
Small Polaron ◽  
Dc Conductivity ◽  
Grain Structure ◽  
Polaron Hopping ◽  
X Ray ◽  
Temperature Dependence Of Conductivity ◽  
Current Voltage ◽  
Sph Model ◽  
Initial Target

TeO2–V2O5–NiO thin films were deposited using thermal evaporation from 40TeO2–([Formula: see text])V2O5–yNiO ([Formula: see text]–30[Formula: see text]mol%) target. Structural analysis of the films was identified by X-ray diffractometry (XRD) and scanning electron microscopy (SEM). The amorphous TeO2–V2O5–NiO films have nanosized clear grain structure and sharp grain boundaries. DC conductivity and current–voltage (I–V) characteristic of TeO2–V2O5–NiO thin films were measured in the temperature range of 300–423[Formula: see text]K. As nickel oxide (NiO) content increases, the DC conductivity decreases up to two orders in value ([Formula: see text]–[Formula: see text][Formula: see text]S[Formula: see text][Formula: see text][Formula: see text]cm[Formula: see text]. Temperature dependence of conductivity is described using the small polaron hopping (SPH) model as well. Poole–Frenkel effect is observed at high external electric field. The optical absorption spectra of the TeO2–V2O5–NiO thin films were recorded in the wavelength range of 380–1100[Formula: see text]nm. The absorption coefficient revealed bandgap shrinkage (3.01–2.3[Formula: see text]eV) and band tail widening, due to an increase in NiO content. Energy dispersive X-ray spectroscopy (EDX) was used to determine elemental composition. In TeO2–V2O5–NiO thin films, the NiO content is around fifth of the initial target.

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